BEM simulation of Wien filters

Ultramicroscopy

Volumn 93, Issue 3-4, 2002, Pages 253-261

  Martinez G ^a   Tsuno, K ^b  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

^b JEOL LTD   (Japan)

Author keywords

Aberration; Electron trajectory; Field calculation; Wien filter

Indexed keywords

BOUNDARY ELEMENT METHOD; ELECTRON OPTICS; OPTICAL DESIGN; OPTICAL DEVICES; PROBLEM SOLVING;

FILTERS;

ELECTROMAGNETISM;

ACCURACY; ARTICLE; BOUNDARY ELEMENT METHOD; ELECTROMAGNETIC FIELD; ELECTRON; FILTER; GEOMETRY; OPTICS; REDUCTION; SIMULATION; TECHNIQUE;

EID: 0036891372     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00282-6     Document Type: Article

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