Magnetic texturing of xenon-ion irradiated nickel films

European Physical Journal B

Volumn 42, Issue 2, 2004, Pages 193-204

  Zhang, K ^a   Lieb, K P ^a   Muller G A ^a   Schaaf, P ^a   Uhrmacher, M ^a   Munzenberg M ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; DOPING (ADDITIVES); IMPURITIES; ION BOMBARDMENT; ION IMPLANTATION; KERR MAGNETOOPTICAL EFFECT; MAGNETIC ANISOTROPY; MAGNETIZATION; MAGNETOMETERS; MICROSTRUCTURE; NICKEL; POLYCRYSTALLINE MATERIALS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; X RAY DIFFRACTION ANALYSIS;

ION ENERGY; MAGNETICAL ORIENTATION ELECTRON MOESSBAUER (MOMS) ANALYSIS; VIBRATING SAMPLE MAGNETOMETRY;

THIN FILMS;

EID: 14744270711     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1140/epjb/e2004-00372-9     Document Type: Article

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