EPMA mapping of small particles of α-AlFeSi and β-AlFeSi in AA6063 alloy billets

Journal of Materials Science

Volumn 38, Issue 7, 2003, Pages 1457-1464

  Osada, Yoshio ^a  

^a Nikkei Analytical Center Ltd   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CRYSTAL MICROSTRUCTURE; DENSITY (SPECIFIC GRAVITY); ELECTRON DEVICES; HEAT TREATMENT; METAL EXTRUSION; MONTE CARLO METHODS; PARTICLE SIZE ANALYSIS; QUALITY CONTROL; TERNARY SYSTEMS; X RAY DIFFRACTION ANALYSIS;

ELECTRON PROBE MICROANALYZER MAPPING PROGRAM; ELECTRON PROBE MICROANALYZERS; SPATIAL DENSITY; SPATIAL DISTRIBUTION; X RAY INTENSITY RATIO;

ALUMINUM ALLOYS;

EID: 0037952931     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1022960228586     Document Type: Article

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