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Volumn , Issue , 2002, Pages 55-59

Technology Trends in Power-Grid-Induced Noise

Author keywords

Power grid noise

Indexed keywords

APPROXIMATION THEORY; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ITERATIVE METHODS; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; SEMICONDUCTOR DEVICES; SPURIOUS SIGNAL NOISE;

EID: 1442309106     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/505358.505360     Document Type: Conference Paper
Times cited : (27)

References (6)
  • 1
    • 0034846652 scopus 로고    scopus 로고
    • Timing Analysis Including Power Supply Noise Effect on Propagation Delay in VLSI Circuits
    • Las Vegas, NV, June
    • G. Bai and B. Static Timing Analysis Including Power Supply Noise Effect on Propagation Delay in VLSI Circuits. In Proc. Design Automation Conference, pages 295-300, Las Vegas, NV, June 2001.
    • (2001) Proc. Design Automation Conference , pp. 295-300
    • Bai, G.1    Static, B.2
  • 3
    • 0032272981 scopus 로고    scopus 로고
    • Modeling the effects of manufacturing variations on high-speed microprocessor interconnect performance
    • V. Mehrotra, S. Nassif, D. Boning, and J. Chung. Modeling the effects of manufacturing variations on high-speed microprocessor interconnect performance. In Proceedings of IEDM, 1998.
    • (1998) Proceedings of IEDM
    • Mehrotra, V.1    Nassif, S.2    Boning, D.3    Chung, J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.