Super-resolution bright-field optical microscopy based on nanometer topographic contrast

Microscopy Research and Technique

Volumn 65, Issue 4-5, 2004, Pages 180-185

  Huang, Shu Wei ^a   Mong, Hong Yao ^b   Lee, Chau Hwang ^b  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b RESEARCH CENTER FOR APPLIED SCIENCES   (Taiwan)

Author keywords

Image restoration; Nanometer depth resolution; Wide field optical profilometer

Indexed keywords

GEOMETRICAL OPTICS; IMAGE ENHANCEMENT; LENSES; LIGHT SOURCES; MAXIMUM LIKELIHOOD ESTIMATION; MAXIMUM PRINCIPLE; OPTICAL RESOLVING POWER; RESTORATION;

BRIGHT-FIELDS; DEPTH RESOLUTION; ESTIMATION ALGORITHM; EXPECTATION MAXIMIZATION; MAXIMUM-LIKELIHOOD ESTIMATION; NANOMETER DEPTH RESOLUTION; OPTICAL PROFILOMETER; SUPERRESOLUTION; WIDE-FIELD; WIDE-FIELD OPTICAL PROFILOMETER;

IMAGE RECONSTRUCTION;

CHROMIUM; POLY(METHYL METHACRYLATE);

ALGORITHM; ARTICLE; BRIGHT FIELD OPTICAL MICROSCOPY; CAMERA; DIFFERENTIAL CONFOCAL MICROSCOPY; ELECTRON BEAM; ILLUMINATION; IMAGE ANALYSIS; IMAGING SYSTEM; MICROSCOPY; NON INTERFEROMETRIC WIDE FIELD OPTICAL PROFILOMETER; OPTICS; PRIORITY JOURNAL; SIGNAL NOISE RATIO; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; IMAGE PROCESSING; INSTRUMENTATION; METHODOLOGY; NANOTECHNOLOGY; PHASE CONTRAST MICROSCOPY;

ALGORITHMS; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, INTERFERENCE; NANOTECHNOLOGY; OPTICS;

EID: 14144253041     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/jemt.20091     Document Type: Article

References (21)

1. Akduman I, Brand U, Grochmalicki J, Hester G, Pike R, Bertero M. 1998. Superresolving masks for incoherent high-numerical-aperture scanning microscopy in three dimensions. J Opt Soc Am A 15:2275-2287.
2. Barty A, Nugent KA, Paganin D, Roberts A. 1998. Quantitative optical phase microscopy. Opt Lett 23:817-819.
3. Carrington WA, Lynch RM, Moore EDW, Isenberg G, Fogarty KE, Fay FS. 1995. Superresolution three-dimensional images of fluorescence in cells with minimal light exposure. Science 268:1483-1486.
4. Conchello J-A. 1998. Superresolution and convergence properties of the expectation-maximization algorithm for maximum-likelihood deconvolution of incoherent images. J Opt Soc Am A 15:2609-2619.
5. Csiszar I. 1991. Why least squares and maximum entropy? An axiomatic approach to inverse problems. Annu Stat 19:2032-2066.
6. Frohn JT, Knapp HF, Stemmer A. 2000. True optical resolution beyond the Rayleigh limit achieved by standing wave illumination. Proc Natl Acad Sci USA 97:7232-7236.
7. Gustafsson MGL. 2000. Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy. J Microsc 198:82-87.
8. Holmes TJ. 1988. Maximum-likelihood image restoration adapted for noncoherent optical imaging. J Opt Soc Am A 5:666-673.
9. Klar TA, Hell SW. 1999. Sub-diffraction resolution in far-field fluorescence microscopy. Opt Lett 24:954-956.
10. Lee C-H, Wang J. 1997. Non-interferometric differential confocal microscopy with 2-nm depth resolution. Opt Commun 135:233-237.
11. Lee C-H, Mong H-Y, Lin W-C. 2002. Non-interferometric wide-field optical profilometry with nanometer depth resolution. Opt Lett 27:1773-1775.
12. Lee C-H, Chiang H-Y, Mong H-Y. 2003. Sub-diffraction-limit imaging based on the topographic contrast of differential confocal microscopy. Opt Lett 28:1772-1774.
13. Markham J, Conchello J-A. 2001. Fast maximum-likelihood image-restoration algorithms for three-dimensional fluorescence microscopy. J Opt Soc Am A 18:1062-1071.
14. McNally JG, Karpova T, Cooper J, Conchello J-A. 1999. Three-dimensional imaging by deconvolution microscopy. Methods 19: 373-385.
15. Neil MAA, Juskaitis R, Wilson T. 1997. Method of obtaining optical sectioning by using structured light in a conventional microscope. Opt Lett 22:1905-1907.
16. Schrader M, Hell SW, van der Voort HTM. 1996. Potential of confocal microscopes to resolve in the 50-100 nm range. Appl Phys Lett 69:3644-3646.
17. Snyder DL, Miller MI. 1991. Random point processes in time and space. New York: Springer-Verlag.
18. Snyder DL, Miller MI, Thomas LJ Jr., Politte DG. 1987. Noise and edge artifacts in maximum-likelihood reconstructions for emission tomography. IEEE Trans Med Imag 6:228-235.
19. Tsai C-W, Lee C-H, Wang J. 1999. Deconvolution of local surface response from topography in nanometer profilometry with a dual-scan method. Opt Lett 24:1732-1734.
20. van Kempen GMP, van der Voort HTM, Bauman JGJ, Strasters KC. 1996. Comparing maximum likelihood estimation and constrained Tikhonov-Miller restoration. IEEE Eng Med Biol 15:76-83.
21. Walker JG, Pike ER, Davies RE, Young MR, Brakenhoff GJ, Bertero M. 1993. Superresolving scanning optical microscopy using holographic optical processing. J Opt Soc Am A 10:59-64.