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Volumn 65, Issue 4-5, 2004, Pages 180-185

Super-resolution bright-field optical microscopy based on nanometer topographic contrast

Author keywords

Image restoration; Nanometer depth resolution; Wide field optical profilometer

Indexed keywords

GEOMETRICAL OPTICS; IMAGE ENHANCEMENT; LENSES; LIGHT SOURCES; MAXIMUM LIKELIHOOD ESTIMATION; MAXIMUM PRINCIPLE; OPTICAL RESOLVING POWER; RESTORATION;

EID: 14144253041     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/jemt.20091     Document Type: Article
Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.