Interaction of cobalt with the Si(1 0 0)2 × 1 surface studied by photoelectron spectroscopy

Surface Science

Volumn 578, Issue 1-3, 2005, Pages 174-182

  Gomoyunova, M V ^a   Pronin, I I ^a   Gall, N R ^a   Vyalikh, D V ^b   Molodtsov, S L ^b  

^a IOFFE INSTITUTE   (Russian Federation)

^b DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Cobalt; Silicon; Solid phase epitaxy; Synchrotron radiation photoelectron spectroscopy

Indexed keywords

ANNEALING; BINDING ENERGY; INTERFACES (MATERIALS); ION BOMBARDMENT; LOW ENERGY ELECTRON DIFFRACTION; MONOCHROMATORS; MONOLAYERS; PHOTOELECTRON SPECTROSCOPY; SILICON; SINGLE CRYSTALS; SYNCHROTRON RADIATION;

CRYSTAL SURFACES; ION SCATTERING SPECTROSCOPY; METALLIC CONDUCTIVITY; SOLID PHASE EPITAXY; SYNCHROTRON RADIATION PHOTOELECTRON SPECTROSCOPY;

COBALT;

EID: 14044252743     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.01.034     Document Type: Article

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