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Volumn 389, Issue 1-2, 2005, Pages 133-139

Formation and morphology of the intermetallic compounds formed at the 91Sn-8.55Zn-0.45Al lead-free solder alloy/Cu interface

Author keywords

91Sn 8.55Zn 0.45Al lead free solder alloy; Cu 6Sn5; Intermetallic compounds; Planar shaped; Scallop shaped; Cu5Zn8; Cu9Al4

Indexed keywords

COPPER; ELECTRON DIFFRACTION; EUTECTICS; FLUXES; INTERFACES (MATERIALS); LEAD; MORPHOLOGY; NITROGEN COMPOUNDS; OXIDATION; PRECIPITATION (CHEMICAL); SCANNING ELECTRON MICROSCOPY; SOLDERING ALLOYS; TIN ALLOYS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 13444269367     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2004.08.009     Document Type: Article
Times cited : (25)

References (25)
  • 3
    • 0026632064 scopus 로고
    • The relevance of current environmental issue to solder joints in microelectronic applications
    • Anaheim, CA, 23-27 February
    • P.J. Walitsky, and F.G. Yost The relevance of current environmental issue to solder joints in microelectronic applications Proceedings of the NEPCON West Anaheim, CA, 23-27 February 1992 1671
    • (1992) Proceedings of the NEPCON West , pp. 1671
    • Walitsky, P.J.1    Yost, F.G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.