-
1
-
-
0345525009
-
Life prediction of solder joints: Engineering mechanics methods
-
D. Frear, W. B. Jones, and K. R. Kinsman, Eds. Warrendale, PA: TMS
-
B. I. Sander, "Life prediction of solder joints: Engineering mechanics methods," in Solder Mechanics: A State of the Art Assessment, D. Frear, W. B. Jones, and K. R. Kinsman, Eds. Warrendale, PA: TMS, 1991, pp. 363-419.
-
(1991)
Solder Mechanics: A State of the Art Assessment
, pp. 363-419
-
-
Sander, B.I.1
-
2
-
-
85036410404
-
A study of the effects of cyclic thermal stresses on a ductile metal
-
L. F. Coffin, Jr., "A study of the effects of cyclic thermal stresses on a ductile metal," Trans. ASME, vol. 76, pp. 931-950, 1954.
-
(1954)
Trans. ASME
, vol.76
, pp. 931-950
-
-
Coffin Jr., L.F.1
-
3
-
-
0003626808
-
-
J. J. Burke, N. L. Reed, and V. Weiss, Eds. New York: Syracuse Univ. Press
-
S. S. Mason and M. H. Hirschberg, Fatigue: An Interdisciplinary Approach, J. J. Burke, N. L. Reed, and V. Weiss, Eds. New York: Syracuse Univ. Press, 1964, pp. 133-173.
-
(1964)
Fatigue: An Interdisciplinary Approach
, pp. 133-173
-
-
Mason, S.S.1
Hirschberg, M.H.2
-
4
-
-
0016567051
-
Effect of low frequency thermal cycling on the crack susceptibility of soldered joints
-
E. R. Bangs and R. E. Beal, "Effect of low frequency thermal cycling on the crack susceptibility of soldered joints," Welding J.: Welding Res. Suppl., vol. 54, pp. 377-s-383-s, 1975.
-
(1975)
Welding J.: Welding Res. Suppl.
, vol.54
-
-
Bangs, E.R.1
Beal, R.E.2
-
5
-
-
0017534819
-
Thermal fatigue failure of soft-soldered contacts to silicon power transistors
-
S. K. Kang, N. D. Zommer, D. L. Feucht, and R. W. Heckel, "Thermal fatigue failure of soft-soldered contacts to silicon power transistors," IEEE Trans. Parts, Hybrids, and Packag., vol. PHP-13, pp. 318-321, 1977.
-
(1977)
IEEE Trans. Parts, Hybrids, and Packag.
, vol.PHP-13
, pp. 318-321
-
-
Kang, S.K.1
Zommer, N.D.2
Feucht, D.L.3
Heckel, R.W.4
-
6
-
-
0024684623
-
Surface-mount attachment reliability of clip-leaded ceramic chip carriers on FR-4 circuit boards
-
W. Engelmaier and A. I. Attarwala, "Surface-mount attachment reliability of clip-leaded ceramic chip carriers on FR-4 circuit boards," IEEE Trans. Comp. Hybrids, Manufact. Technol., vol. 12, pp. 284-296, 1989.
-
(1989)
IEEE Trans. Comp. Hybrids, Manufact. Technol.
, vol.12
, pp. 284-296
-
-
Engelmaier, W.1
Attarwala, A.I.2
-
7
-
-
0027658672
-
Thermal fatigue of low-temperature solder alloys in insertion mount assembly
-
J. Seyyedi, "Thermal fatigue of low-temperature solder alloys in insertion mount assembly," Trans. ASME J. Electron. Packag., vol. 115, pp. 305-311, 1993.
-
(1993)
Trans. ASME J. Electron. Packag.
, vol.115
, pp. 305-311
-
-
Seyyedi, J.1
-
8
-
-
0028494497
-
Failure analysis of no-clean and water-clean solder joints 0.4 mm pitch, 256-pin plastic quad flat pack
-
R. K. Govila, Y.-H. Pao, C. Lamer, J. Lau, S. Twerefour, S. Erasmus, and S. Dolot, "Failure analysis of no-clean and water-clean solder joints 0.4 mm pitch, 256-pin plastic quad flat pack," Trans. ASME J. Electron. Packag., vol. 116, pp. 184-190, 1994.
-
(1994)
Trans. ASME J. Electron. Packag.
, vol.116
, pp. 184-190
-
-
Govila, R.K.1
Pao, Y.-H.2
Lamer, C.3
Lau, J.4
Twerefour, S.5
Erasmus, S.6
Dolot, S.7
-
9
-
-
0024626724
-
A fracture mechanics approach to soldered joint cracking
-
S. E. Yamada, "A fracture mechanics approach to soldered joint cracking," IEEE Trans. Comp. Hybrids, Manufact. Technol., vol. 12, no. 1, pp. 99-104, 1989.
-
(1989)
IEEE Trans. Comp. Hybrids, Manufact. Technol.
, vol.12
, Issue.1
, pp. 99-104
-
-
Yamada, S.E.1
-
10
-
-
0025445062
-
Determination of stress intensity factors for interfacial cracks in bimaterial systems
-
Y.-H. Pao and T.-Y. Pan, "Determination of stress intensity factors for interfacial cracks in bimaterial systems," Trans. ASME J. Electron. Packag., vol. 112, pp. 154-161, 1990.
-
(1990)
Trans. ASME J. Electron. Packag.
, vol.112
, pp. 154-161
-
-
Pao, Y.-H.1
Pan, T.-Y.2
-
11
-
-
0029753156
-
Subcritical crack growth at bi-material interfaces: Part I, flexural peel technique
-
Z. Zhang and J. K. Shang, "Subcritical crack growth at bi-material interfaces: Part I, flexural peel technique," Metall. Mater. Trans., vol. 27A, pp. 205-211, 1996.
-
(1996)
Metall. Mater. Trans.
, vol.27 A
, pp. 205-211
-
-
Zhang, Z.1
Shang, J.K.2
-
12
-
-
33748878086
-
-
ASME special publication, 95-WA/EEP-12,New York
-
D. Yao, Z. Zhang, and J. K. Shang, "Finite element analysis of solder/Cu interface cracks," ASME special publication, 95-WA/EEP-12,New York 1995.
-
(1995)
Finite Element Analysis of Solder/Cu Interface Cracks
-
-
Yao, D.1
Zhang, Z.2
Shang, J.K.3
-
13
-
-
51649150578
-
Effects of cooling rate on mechanical properties of near-eutectic tin-lead solder joints
-
Z. Mei, J. W. Morris, Jr., M. C. Shine, and T. S. E. Summers, "Effects of cooling rate on mechanical properties of near-eutectic tin-lead solder joints," J. Electron. Mater., vol. 20, no. 8, pp. 599-608, 1991.
-
(1991)
J. Electron. Mater.
, vol.20
, Issue.8
, pp. 599-608
-
-
Mei, Z.1
Morris Jr., J.W.2
Shine, M.C.3
Summers, T.S.E.4
-
14
-
-
84966468108
-
Fatigue lives on 60Sn/40Pb solder joints made with different cooling rates
-
Z. Mei and J. W. Morris, Jr., "Fatigue lives on 60Sn/40Pb solder joints made with different cooling rates," Trans. ASME J. Electron. Packag., vol. 114, pp. 104-108, 1992.
-
(1992)
Trans. ASME J. Electron. Packag.
, vol.114
, pp. 104-108
-
-
Mei, Z.1
Morris Jr., J.W.2
-
15
-
-
0039972502
-
Intel-metallic growth in tin-rich solders
-
L. Zakraysek, "Intel-metallic growth in tin-rich solders," Welding J.: Welding Res. Suppl., vol. 51, pp. 536-s-541-s, 1972.
-
(1972)
Welding J.: Welding Res. Suppl.
, vol.51
-
-
Zakraysek, L.1
-
16
-
-
0015602104
-
An investigation of soldered copper-tin bond brittleness by electron microscopy
-
P. L. Blum, J. Pelissier, and G. Silvestre, "An investigation of soldered copper-tin bond brittleness by electron microscopy," Solid State Technol., vol. 16, no. 3, pp. 55-58, 1973.
-
(1973)
Solid State Technol.
, vol.16
, Issue.3
, pp. 55-58
-
-
Blum, P.L.1
Pelissier, J.2
Silvestre, G.3
-
17
-
-
0015614563
-
Interdiffusion and reaction in bimetallic Cu-Sn thin films
-
K. N. Tu, "Interdiffusion and reaction in bimetallic Cu-Sn thin films," Acta Metall., vol. 21, pp. 347-354, 1973.
-
(1973)
Acta Metall.
, vol.21
, pp. 347-354
-
-
Tu, K.N.1
-
18
-
-
0027579446
-
The fracture resistance of metal ceramic interfaces
-
A. G. Evans and B. J. Dalgleish, "The fracture resistance of metal ceramic interfaces," Mater. Sic. Eng. A, vol. 162, pp. 1-13, 1993.
-
(1993)
Mater. Sic. Eng. A
, vol.162
, pp. 1-13
-
-
Evans, A.G.1
Dalgleish, B.J.2
-
19
-
-
0029392303
-
Effect of aging on fatigue crack growth at Sn-Pb/Cu interfaces
-
D. Yao and J. K. Shang, "Effect of aging on fatigue crack growth at Sn-Pb/Cu interfaces," Metall. Mater. Trans. A, vol. 26A, pp. 2677-2685, 1995.
-
(1995)
Metall. Mater. Trans. A
, vol.26 A
, pp. 2677-2685
-
-
Yao, D.1
Shang, J.K.2
-
20
-
-
0029759803
-
Subcritical crack growth at bi-material interfaces: Part III, shear-enhanced fatigue crack resistance at polymer/metal interface
-
Z. Zhang and J. K. Shang, "Subcritical crack growth at bi-material interfaces: Part III, shear-enhanced fatigue crack resistance at polymer/metal interface," Metall. Mater. Trans. A, vol. 27A, pp. 221-228, 1996.
-
(1996)
Metall. Mater. Trans. A
, vol.27 A
, pp. 221-228
-
-
Zhang, Z.1
Shang, J.K.2
-
21
-
-
0016101810
-
Mechanical properties of cast tin-lead solder
-
H. J. Rack and J. K. Maurin, "Mechanical properties of cast tin-lead solder," J. Testing Evaluation, vol. 2, pp. 351-354, 1974.
-
(1974)
J. Testing Evaluation
, vol.2
, pp. 351-354
-
-
Rack, H.J.1
Maurin, J.K.2
-
22
-
-
0025564127
-
Effects of plasticity on the crack propagation resistance of a metal/ceramic interface
-
I. E. Reimanis, B. J. Dalgleish, M. Brahy, M. Ruhle, and A. G. Evans, "Effects of plasticity on the crack propagation resistance of a metal/ceramic interface," Acta Metall. Mater., vol. 38, pp. 2645-2652, 1990.
-
(1990)
Acta Metall. Mater.
, vol.38
, pp. 2645-2652
-
-
Reimanis, I.E.1
Dalgleish, B.J.2
Brahy, M.3
Ruhle, M.4
Evans, A.G.5
-
23
-
-
0029775509
-
Subcritical crack growth at bi-material interfaces: Part II: Microstructural effects on fracture resistance of metal/ceramic interfaces
-
G. Liu and J. K. Shang, "Subcritical crack growth at bi-material interfaces: Part II: Microstructural effects on fracture resistance of metal/ceramic interfaces," Metall. Mater. Trans. A, vol. 27A, pp. 213-219, 1996.
-
(1996)
Metall. Mater. Trans. A
, vol.27 A
, pp. 213-219
-
-
Liu, G.1
Shang, J.K.2
-
24
-
-
0024054439
-
Mechanism of fatigue crack propagation in metals, ceramics, and composites: Role of crack tip shielding
-
R. O. Ritchie, "Mechanism of fatigue crack propagation in metals, ceramics, and composites: Role of crack tip shielding," Mater. Sci. Engng., vol. 103A, pp. 15-28, 1988.
-
(1988)
Mater. Sci. Engng.
, vol.103 A
, pp. 15-28
-
-
Ritchie, R.O.1
-
26
-
-
0023979063
-
Elastic fracture mechanics concepts for interfacial cracks
-
J. R. Rice, "Elastic fracture mechanics concepts for interfacial cracks," J. Appl. Mech., vol. 55, pp. 98-103, 1988.
-
(1988)
J. Appl. Mech.
, vol.55
, pp. 98-103
-
-
Rice, J.R.1
-
27
-
-
1542389169
-
Monotonic properties and low-cycle fatigue of several soft solder alloy systems
-
P. J. Singh, Ed. Materials Park, OH: ASM International
-
Z. Guo, A. F. Sprecher, Jr., H. Conrad, and M. Kim, "Monotonic properties and low-cycle fatigue of several soft solder alloy systems," in Materials Developments in Microelectronic Packaging: Performance and Reliability. P. J. Singh, Ed. Materials Park, OH: ASM International, 1991, pp. 155-162.
-
(1991)
Materials Developments in Microelectronic Packaging: Performance and Reliability
, pp. 155-162
-
-
Guo, Z.1
Sprecher Jr., A.F.2
Conrad, H.3
Kim, M.4
-
28
-
-
0024734823
-
Elastic yield zone around an interfacial crack tip
-
E. Zywicz and D. M. Parks, "Elastic yield zone around an interfacial crack tip," J. Appl. Mech., vol. 56, pp. 577-584, 1989.
-
(1989)
J. Appl. Mech.
, vol.56
, pp. 577-584
-
-
Zywicz, E.1
Parks, D.M.2
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