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Volumn 242, Issue 3-4, 2005, Pages 220-235
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Monte Carlo simulations of electron transport in solids: Applications to electron backscattering from surfaces
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Author keywords
Auger electron spectroscopy; Copper; Electron solid interactions; Gold; Monte Carlo simulations; Silicon
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
BACKSCATTERING;
COPPER;
GOLD;
IONIZATION;
MONTE CARLO METHODS;
SILICON;
SOLIDS;
X RAY PHOTOELECTRON SPECTROSCOPY;
AUGER ELECTRON EMISSION;
ELECTRON INTENSITY;
ELECTRON-SOLID INTERACTIONS;
SCANNING AUGER ELECTRON MICROSCOPY (SAM);
ELECTRON TRANSPORT PROPERTIES;
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EID: 13444252708
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2004.08.017 Document Type: Article |
Times cited : (8)
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References (15)
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