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Volumn 242, Issue 3-4, 2005, Pages 220-235

Monte Carlo simulations of electron transport in solids: Applications to electron backscattering from surfaces

Author keywords

Auger electron spectroscopy; Copper; Electron solid interactions; Gold; Monte Carlo simulations; Silicon

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; BACKSCATTERING; COPPER; GOLD; IONIZATION; MONTE CARLO METHODS; SILICON; SOLIDS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 13444252708     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.08.017     Document Type: Article
Times cited : (8)

References (15)
  • 9
    • 10644291223 scopus 로고    scopus 로고
    • NIST electron elastic-scattering cross-section database, Version 3.1
    • National Institute of Standards and Technology, Gaithersburg, MD
    • A. Jablonski, F. Salvat, C.J. Powell, NIST Electron Elastic-scattering Cross-section Database, Version 3.1, Standard Reference Data Program Database 64, National Institute of Standards and Technology, Gaithersburg, MD, 2003. http://www.nist.gov/srd/nist64.htm.
    • (2003) Standard Reference Data Program Database , vol.64
    • Jablonski, A.1    Salvat, F.2    Powell, C.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.