Seamless Test of Digital Components in Mixed-Signal Paths

IEEE Design and Test of Computers

Volumn 21, Issue 1, 2004, Pages 44-55

  Ozev, Sule ^a   Bayraktaroglu, Ismet ^b   Orailoglu, Alex ^c  

^a DUKE UNIVERSITY   (United States)

^b SUN MICROSYSTEMS   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIRECT MEMORY ACCESS (DMA); MIXED SIGNAL CIRCUITS; SILICON-ON-CHIP (SOC) TECHNOLOGY;

ANALOG TO DIGITAL CONVERSION; COMPUTER SIMULATION; CORRELATION THEORY; DIGITAL FILTERS; DIGITAL STORAGE; DIGITAL TO ANALOG CONVERSION; ELECTRIC FAULT CURRENTS; INTERFACES (COMPUTER); LOGIC CIRCUITS; MICROPROCESSOR CHIPS; MIXER CIRCUITS; MONTE CARLO METHODS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE TESTING; SIGNAL TO NOISE RATIO; THERMAL NOISE;

DIGITAL SIGNAL PROCESSING;

EID: 1342323836     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2004.1261849     Document Type: Article

References (10)

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