Influence of vacuum-annealing process on the secondary electron emission coefficient (γ) from a MgO protective layer

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 3 A, 2001, Pages 1433-1434

  Jeoung, J M ^a   Lim, J Y ^a   Kim, Y G ^a   Seo, Y ^a   Cho, G S ^a   Choi, E H ^a  

^a Kwangwoon University   (South Korea)

Author keywords

AC PDPs; Secondary electron emission coefficient; Vacuum annealed MgO films

Indexed keywords

ANNEALING; ION BEAMS; ION BOMBARDMENT; MAGNESIA; METALLIC FILMS; PLASMA DISPLAY DEVICES; SPUTTER DEPOSITION; VACUUM;

SECONDARY ELECTRON EMISSION COEFFICIENT;

SECONDARY EMISSION;

EID: 0035269771     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.1433     Document Type: Article

References (8)