-
1
-
-
0033280627
-
'Future perspective and scaling down roadmap for RF CMOS'
-
Morifuji, E., MoMose, H.S., Ohguro, T., Yoshitomi, T., and Kimijima, H.: 'Future perspective and scaling down roadmap for RF CMOS'. Proc Symp. VLSI Technology, 1999, pp. 163-164
-
(1999)
Proc. Symp. VLSI Technology
, pp. 163-164
-
-
Morifuji, E.1
MoMose, H.S.2
Ohguro, T.3
Yoshitomi, T.4
Kimijima, H.5
-
2
-
-
0033097335
-
'Microwave CMOS - Device physics and design'
-
Manku, T.: 'Microwave CMOS - device physics and design', IEEE J. Solid-State Circuits, 1999, 34, (3)
-
(1999)
IEEE J. Solid-State Circuits
, vol.34
, Issue.3
-
-
Manku, T.1
-
3
-
-
0000552355
-
'A simple subcircuit extension of the BSIM3v3 Model'
-
Tin, S.F., Osman, A.A., and Mayaram, K.: 'A simple subcircuit extension of the BSIM3v3 Model', IEEE J. Solid-State Circuits, 2000, 35 (4), pp. 612-624
-
(2000)
IEEE J. Solid-State Circuits
, vol.35
, Issue.4
, pp. 612-624
-
-
Tin, S.F.1
Osman, A.A.2
Mayaram, K.3
-
4
-
-
0032654437
-
'A new extraction method for BSIM3v3 model parameters of RF silicon MOSFETs'
-
Goteborg, Sweden, Mar
-
Lee, S., and Yu, H.K.: 'A new extraction method for BSIM3v3 model parameters of RF silicon MOSFETs'. Proc. IEEE Int. Conf. on Microelectronic Test Structures, Goteborg, Sweden, Mar 1999, pp. 95-98
-
(1999)
Proc. IEEE Int. Conf. on Microelectronic Test Structures
, pp. 95-98
-
-
Lee, S.1
Yu, H.K.2
-
5
-
-
0028018569
-
'Extracting small-signal model parameters of silicon MOSFET transistors'
-
San Diego, CA, USA
-
Lovelace, D., Costa, J., and Camilleri, N.: 'Extracting small-signal model parameters of silicon MOSFET transistors'. Digest of IEEE MTT-S Int. Microw. Symp., San Diego, CA, USA, 1994, pp. 865-868
-
(1994)
Digest of IEEE MTT-S Int. Microw. Symp.
, pp. 865-868
-
-
Lovelace, D.1
Costa, J.2
Camilleri, N.3
-
6
-
-
0031098333
-
'A novel approach to extracting small-signal model parameters of silicon MOSFET's'
-
Lee, S., Yu, H.K., Kim, C.S., Koo, J.G., and Nam, K.S.: 'A novel approach to extracting small-signal model parameters of silicon MOSFET's', IEEE Microw. Guided Wave Lett., 1997, 7, (3)
-
(1997)
IEEE Microw. Guided Wave Lett.
, vol.7
, Issue.3
-
-
Lee, S.1
Yu, H.K.2
Kim, C.S.3
Koo, J.G.4
Nam, K.S.5
-
7
-
-
0033221855
-
'Accurate modeling and parameter extraction for MOS transistors valid up to 10 GHz'
-
Jen, S.H.M., Enz, C.C., Pehlke, D.R., Schroter, M., and Sheu, B.J.: 'Accurate modeling and parameter extraction for MOS transistors valid up to 10 GHz', IEEE Trans. Electron Devices, 1999, 46, (11)
-
(1999)
IEEE Trans. Electron Devices
, vol.46
, Issue.11
-
-
Jen, S.H.M.1
Enz, C.C.2
Pehlke, D.R.3
Schroter, M.4
Sheu, B.J.5
-
8
-
-
0036602363
-
'A simple and analytical parameter-extraction method of a microwave MOSFET'
-
Kwon, I., Je, M., Lee, K., and Shin, H.: 'A simple and analytical parameter-extraction method of a microwave MOSFET', IEEE Trans. Microw. Theory Tech., 2002, 50, (6)
-
(2002)
IEEE Trans. Microw. Theory Tech.
, vol.50
, Issue.6
-
-
Kwon, I.1
Je, M.2
Lee, K.3
Shin, H.4
-
9
-
-
0027152591
-
'Mechanistic interpretation of the transcapacitance element'
-
Apr
-
Calvo, M., Winson, P., and Snider, A.D.: 'Mechanistic interpretation of the transcapacitance element'. Proc. IEEE Southeast Conf., Apr. 1993, p. 4
-
(1993)
Proc. IEEE Southeast Conf.
, pp. 4
-
-
Calvo, M.1
Winson, P.2
Snider, A.D.3
-
10
-
-
0032277985
-
'An effective gate resistance model for CMOS RF and noise modeling'
-
Dec
-
Jin, X., Ou, J.-J., Chen, C.-H., Liu, W., Deen, M.J., Gray, P.R., and Hu, C.: 'An effective gate resistance model for CMOS RF and noise modeling'. Technical Digest of International Electron Devices Meeting, Dec 1998, pp. 961-964
-
(1998)
Technical Digest of International Electron Devices Meeting
, pp. 961-964
-
-
Jin, X.1
Ou, J.-J.2
Chen, C.-H.3
Liu, W.4
Deen, M.J.5
Gray, P.R.6
Hu, C.7
-
11
-
-
0033700101
-
'MOSFET modeling for RF circuit design'
-
Cancun, Mexico, Mar
-
Cheng, Y., Chen, C.H., Enz, C., Matloubian, M., and Deen, M.J.: 'MOSFET modeling for RF circuit design'. Proc. 3rd IEEE Int. Caracas Conf. on Devices, Circuits and Systems (ICCDCS 2000), Cancun, Mexico, Mar 2000, pp. D23/1-8
-
(2000)
Proc. 3rd IEEE Int. Caracas Conf. on Devices, Circuits and Systems (ICCDCS 2000)
-
-
Cheng, Y.1
Chen, C.H.2
Enz, C.3
Matloubian, M.4
Deen, M.J.5
-
12
-
-
0242594121
-
'MOSFET modeling for RF IC design'
-
Cheng, Y.H.: 'MOSFET modeling for RF IC design', Int. J. High Speed Electron Syst., 2001, 11, (4), pp. 1007-1084
-
(2001)
Int. J. High Speed Electron Syst.
, vol.11
, Issue.4
, pp. 1007-1084
-
-
Cheng, Y.H.1
-
13
-
-
0033879027
-
'MOS transistor modeling for RF IC design'
-
Enz, C., and Cheng, Y.H.: 'MOS transistor modeling for RF IC design', IEEE J. Solid-State Circuits, 35, (2), pp. 186-201
-
IEEE J. Solid-State Circuits
, vol.35
, Issue.2
, pp. 186-201
-
-
Enz, C.1
Cheng, Y.H.2
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