메뉴 건너뛰기




Volumn 151, Issue 6, 2004, Pages 587-592

Simple and accurate extraction methodology for RF MOSFET valid up to 20 GHz

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CAPACITORS; COMPUTER SIMULATION; ELECTRIC RESISTANCE; EQUIVALENT CIRCUITS; MATHEMATICAL MODELS; OPTIMIZATION; REGRESSION ANALYSIS;

EID: 13244267015     PISSN: 13502409     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1049/ip-cds:20040778     Document Type: Article
Times cited : (20)

References (13)
  • 2
    • 0033097335 scopus 로고    scopus 로고
    • 'Microwave CMOS - Device physics and design'
    • Manku, T.: 'Microwave CMOS - device physics and design', IEEE J. Solid-State Circuits, 1999, 34, (3)
    • (1999) IEEE J. Solid-State Circuits , vol.34 , Issue.3
    • Manku, T.1
  • 3
    • 0000552355 scopus 로고    scopus 로고
    • 'A simple subcircuit extension of the BSIM3v3 Model'
    • Tin, S.F., Osman, A.A., and Mayaram, K.: 'A simple subcircuit extension of the BSIM3v3 Model', IEEE J. Solid-State Circuits, 2000, 35 (4), pp. 612-624
    • (2000) IEEE J. Solid-State Circuits , vol.35 , Issue.4 , pp. 612-624
    • Tin, S.F.1    Osman, A.A.2    Mayaram, K.3
  • 4
    • 0032654437 scopus 로고    scopus 로고
    • 'A new extraction method for BSIM3v3 model parameters of RF silicon MOSFETs'
    • Goteborg, Sweden, Mar
    • Lee, S., and Yu, H.K.: 'A new extraction method for BSIM3v3 model parameters of RF silicon MOSFETs'. Proc. IEEE Int. Conf. on Microelectronic Test Structures, Goteborg, Sweden, Mar 1999, pp. 95-98
    • (1999) Proc. IEEE Int. Conf. on Microelectronic Test Structures , pp. 95-98
    • Lee, S.1    Yu, H.K.2
  • 5
    • 0028018569 scopus 로고
    • 'Extracting small-signal model parameters of silicon MOSFET transistors'
    • San Diego, CA, USA
    • Lovelace, D., Costa, J., and Camilleri, N.: 'Extracting small-signal model parameters of silicon MOSFET transistors'. Digest of IEEE MTT-S Int. Microw. Symp., San Diego, CA, USA, 1994, pp. 865-868
    • (1994) Digest of IEEE MTT-S Int. Microw. Symp. , pp. 865-868
    • Lovelace, D.1    Costa, J.2    Camilleri, N.3
  • 6
    • 0031098333 scopus 로고    scopus 로고
    • 'A novel approach to extracting small-signal model parameters of silicon MOSFET's'
    • Lee, S., Yu, H.K., Kim, C.S., Koo, J.G., and Nam, K.S.: 'A novel approach to extracting small-signal model parameters of silicon MOSFET's', IEEE Microw. Guided Wave Lett., 1997, 7, (3)
    • (1997) IEEE Microw. Guided Wave Lett. , vol.7 , Issue.3
    • Lee, S.1    Yu, H.K.2    Kim, C.S.3    Koo, J.G.4    Nam, K.S.5
  • 8
    • 0036602363 scopus 로고    scopus 로고
    • 'A simple and analytical parameter-extraction method of a microwave MOSFET'
    • Kwon, I., Je, M., Lee, K., and Shin, H.: 'A simple and analytical parameter-extraction method of a microwave MOSFET', IEEE Trans. Microw. Theory Tech., 2002, 50, (6)
    • (2002) IEEE Trans. Microw. Theory Tech. , vol.50 , Issue.6
    • Kwon, I.1    Je, M.2    Lee, K.3    Shin, H.4
  • 9
    • 0027152591 scopus 로고
    • 'Mechanistic interpretation of the transcapacitance element'
    • Apr
    • Calvo, M., Winson, P., and Snider, A.D.: 'Mechanistic interpretation of the transcapacitance element'. Proc. IEEE Southeast Conf., Apr. 1993, p. 4
    • (1993) Proc. IEEE Southeast Conf. , pp. 4
    • Calvo, M.1    Winson, P.2    Snider, A.D.3
  • 12
    • 0242594121 scopus 로고    scopus 로고
    • 'MOSFET modeling for RF IC design'
    • Cheng, Y.H.: 'MOSFET modeling for RF IC design', Int. J. High Speed Electron Syst., 2001, 11, (4), pp. 1007-1084
    • (2001) Int. J. High Speed Electron Syst. , vol.11 , Issue.4 , pp. 1007-1084
    • Cheng, Y.H.1
  • 13
    • 0033879027 scopus 로고    scopus 로고
    • 'MOS transistor modeling for RF IC design'
    • Enz, C., and Cheng, Y.H.: 'MOS transistor modeling for RF IC design', IEEE J. Solid-State Circuits, 35, (2), pp. 186-201
    • IEEE J. Solid-State Circuits , vol.35 , Issue.2 , pp. 186-201
    • Enz, C.1    Cheng, Y.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.