New extraction method for BSIM3v3 model parameters of RF silicon MOSFETs

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1999, Pages 95-98

  Lee, Seonghearn ^a   Yu, Hyun Kyu ^a  

^a Hankuk University of Foreign Studies   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; ELECTRIC CONDUCTANCE; ELECTRIC NETWORK PARAMETERS; ELECTRIC RESISTANCE; OPTIMIZATION; SEMICONDUCTOR DEVICE MODELS;

EXTRACTION METHOD; SOFTWARE PACKAGE SPICE; Z-PARAMETER EQUATIONS;

MOSFET DEVICES;

EID: 0032654437     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (12)