Impact of on-chip interconnect frequency-dependent R(f) L(f) on digital and RF design

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 13, Issue 1, 2005, Pages 158-162

  Cao, Yu ^a   Huang, Xuejue ^b   Sylvester, Dennis ^c   King, Tsu Jae ^d   Hu, Chenming ^d  

^a Arizona State University   (United States)

^b RAMBUS INC   (United States)

^c UNIVERSITY OF MICHIGAN   (United States)

^d UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Delay; Frequency dependence; Inductance; Noise; Over shoot; Quality factor; Resistance; Slew rate

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; ELECTRIC POTENTIAL; ELECTRIC POWER SYSTEMS; ELECTRIC RESISTANCE; INDUCTANCE; SIGNAL PROCESSING; SPURIOUS SIGNAL NOISE;

DELAY; FREQUENCY DEPENDENCE; NOISE; OVER-SHOOT; QUALITY FACTOR; RADIO FREQUENCY; SIEW RATE;

MICROPROCESSOR CHIPS;

EID: 13144278327     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2004.840399     Document Type: Article

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