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Volumn , Issue , 2000, Pages 487-490
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On-chip inductance modeling and RLC extraction of VLSI interconnects for circuit simulation
a a a a b c |
Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELECTRIC PROPERTIES;
FREQUENCIES;
INTEGRATED CIRCUIT LAYOUT;
INTEGRATED CIRCUIT TESTING;
INTERCONNECTION NETWORKS;
MULTICHIP MODULES;
SPURIOUS SIGNAL NOISE;
CRITICAL GLOBAL WIRE INDUCTIVE EFFECTS;
GROUND INDUCTIVE NOISE;
ON CHIP INDUCTABLE MODELLING;
WHOLE CHIP EXTRACTION SCREENING PROCESS;
VLSI CIRCUITS;
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EID: 0033712809
PISSN: 08865930
EISSN: None
Source Type: Journal
DOI: 10.1109/CICC.2000.852714 Document Type: Article |
Times cited : (63)
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References (6)
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