Influence of Zr/Ti ratio and preferred orientation on polarization switching and domain configuration of Pb(Zr1-x Tix)O3 thin films

Journal of the Korean Physical Society

Volumn 42, Issue SUPPL., 2003, Pages

  Lee, Young Hyun ^a   Lee, Jung Kun ^a   Hong, Kug Sun ^a  

^a Seoul National University   (South Korea)

Author keywords

Domain engineering; Internal stress; PZT thin film; Switching current

Indexed keywords

EID: 12944311792     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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