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Volumn 45, Issue SUPPL., 2004, Pages
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Study on the etch characteristics of BST thin films by using inductively coupled plasma
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Author keywords
BST; Etching; ICP; OES; QMS
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Indexed keywords
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EID: 12744258017
PISSN: 03744884
EISSN: None
Source Type: Journal
DOI: None Document Type: Conference Paper |
Times cited : (6)
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References (10)
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