메뉴 건너뛰기




Volumn 45, Issue 8, 1996, Pages 881-891

A methodology for the rapid injection of transient hardware errors

Author keywords

Fault tolerance; Hybrid fault emulation; IBM ROMP; Register transfer language modeling; Software implementedfault injection; Verilog modeling

Indexed keywords

COMPUTATIONAL COMPLEXITY; COMPUTER HARDWARE; COMPUTER SIMULATION; COMPUTER SYSTEM RECOVERY; COMPUTER TESTING; ERROR ANALYSIS; PROGRAM PROCESSORS; REDUCED INSTRUCTION SET COMPUTING;

EID: 0030216035     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.536231     Document Type: Article
Times cited : (31)

References (29)
  • 1
    • 0024897024 scopus 로고
    • Fault-Injection for Dependability Validation of Fault-Tolerant Computing Systems
    • IEEE CS Press, June
    • J. Arlat, Y. Crouzet, and J.C. Laprie, "Fault-Injection for Dependability Validation of Fault-Tolerant Computing Systems," Proc. 19th Int'l Symp. Fault-Tolerant Computing (FTCS19), pp. 348-355. IEEE CS Press, June, 1989.
    • (1989) Proc. 19th Int'l Symp. Fault-Tolerant Computing (FTCS19) , pp. 348-355
    • Arlat, J.1    Crouzet, Y.2    Laprie, J.C.3
  • 3
    • 0021439084 scopus 로고
    • Functional Testing of Microprocessors
    • June
    • D. Brahme and J.A. Abraham, "Functional Testing of Microprocessors," IEEE Trans. Computers, vol. 33, no. 6, pp. 475-485, June 1984.
    • (1984) IEEE Trans. Computers , vol.33 , Issue.6 , pp. 475-485
    • Brahme, D.1    Abraham, J.A.2
  • 4
    • 27544463457 scopus 로고
    • FOCUS: An Experimental Environment for Fault Sensitivity Analysis
    • May
    • G.S. Choi and R.K. Iyer, "FOCUS: An Experimental Environment for Fault Sensitivity Analysis," IEEE Trans. Computers, vol. 41, no. 5, May 1992.
    • (1992) IEEE Trans. Computers , vol.41 , Issue.5
    • Choi, G.S.1    Iyer, R.K.2
  • 5
    • 0022188383 scopus 로고
    • SEU Vulnerability of the ZILOG Z-80 and NSC-800 Microprocessors
    • Dec.
    • J. Cusick, "SEU Vulnerability of the ZILOG Z-80 and NSC-800 Microprocessors," IEEE Trans. Nuclear Science, vol. 32, no. 46, pp. 4,206-4,211, Dec. 1985.
    • (1985) IEEE Trans. Nuclear Science , vol.32 , Issue.46 , pp. 4206-4211
    • Cusick, J.1
  • 7
    • 0026869701 scopus 로고
    • Observations on the Effects of Fault Manifestation as a Function of Workload
    • May
    • E. Czeck and D. Siewiorek, "Observations on the Effects of Fault Manifestation as a Function of Workload," IEEE Trans. Computers, vol. 41, no. 5, pp. 559-564, May 1992.
    • (1992) IEEE Trans. Computers , vol.41 , Issue.5 , pp. 559-564
    • Czeck, E.1    Siewiorek, D.2
  • 10
    • 0025507906 scopus 로고
    • On Measurement and Modeling of Computer Systems Dependability: A Dialog among Experts
    • Apr.
    • J.B. Dugan, "On Measurement and Modeling of Computer Systems Dependability: A Dialog Among Experts," IEEE Trans. Computers, vol. 39, no. 4, pp. 506-509, Apr. 1990.
    • (1990) IEEE Trans. Computers , vol.39 , Issue.4 , pp. 506-509
    • Dugan, J.B.1
  • 11
    • 0024873086 scopus 로고
    • Evaluation of Error Detection Schemes Using Fault Injection by Heavy-Ion Radiation
    • IEEE CS Press, June
    • A. Gunneflo, J. Karlsson, and J. Torin, "Evaluation of Error Detection Schemes Using Fault Injection by Heavy-Ion Radiation," Proc. 19th Int'l Symp. Fault-Tolerant Computing (FTCS19), pp. 340-347. IEEE CS Press, June 1989.
    • (1989) Proc. 19th Int'l Symp. Fault-Tolerant Computing (FTCS19) , pp. 340-347
    • Gunneflo, A.1    Karlsson, J.2    Torin, J.3
  • 12
    • 33747613237 scopus 로고
    • IBM RT Personal Computer Technology
    • IBM
    • "IBM RT Personal Computer Technology," Technical Report SA23-1057, IBM, 1986.
    • (1986) Technical Report SA23-1057
  • 13
    • 0022734032 scopus 로고
    • A Measurement-Based Model for Workload Dependence of CPU Errors
    • June
    • R.K. Iyer and D.J. Rossetti, "A Measurement-Based Model for Workload Dependence of CPU Errors," IEEE Trans. Computers, vol. 35, no. 6, pp. 511-519, June 1986.
    • (1986) IEEE Trans. Computers , vol.35 , Issue.6 , pp. 511-519
    • Iyer, R.K.1    Rossetti, D.J.2
  • 16
    • 33747627985 scopus 로고
    • A High-Level Error Model Automatic Extractor
    • Computer Eng. Research Center, Univ. of Texas at Austin, Jan.
    • G.A. Kanawati, N.A. Kanawati, and J.A. Abraham, "A High-Level Error Model Automatic Extractor," Technical Report UT-CERC-TR-JAA93-01, Computer Eng. Research Center, Univ. of Texas at Austin, Jan. 1993.
    • (1993) Technical Report UT-CERC-TR-JAA93-01
    • Kanawati, G.A.1    Kanawati, N.A.2    Abraham, J.A.3
  • 17
    • 0018331014 scopus 로고
    • Alpha-Particle-Induced Soft Errors in Dynamic Memories
    • Jan.
    • T. May and M. Woods, "Alpha-Particle-Induced Soft Errors in Dynamic Memories," IEEE Trans. Electron Devices, vol. 262-9, Jan. 1979.
    • (1979) IEEE Trans. Electron Devices , vol.262 , Issue.9
    • May, T.1    Woods, M.2
  • 19
    • 84881290765 scopus 로고
    • A Study of the Effects of Transient Fault Injection into a 32-bit RISC with Built-in Watchdog
    • IEEE CS Press, July
    • J. Ohlsson, M. Rimen, and U. Gunneflo, "A Study of the Effects of Transient Fault Injection into a 32-bit RISC with Built-in Watchdog," Proc. 22nd Int'l Symp. Fault-Tolerant Computing (FTCS22), pp. 316-325. IEEE CS Press, July 1992.
    • (1992) Proc. 22nd Int'l Symp. Fault-Tolerant Computing (FTCS22) , pp. 316-325
    • Ohlsson, J.1    Rimen, M.2    Gunneflo, U.3
  • 29
    • 33747616576 scopus 로고
    • Software-Implemented Fault Injection of Transient Hardware Errors
    • G.M. Koob, C.G. Law, eds., chap. 3.1, Kluwer Academic Publishers
    • C.R. Yount and D.P. Siewiorek, "Software-Implemented Fault Injection of Transient Hardware Errors," Foundations of Dependable Computing: Models and Frameworks for Dependable Systems, G.M. Koob, C.G. Law, eds., chap. 3.1, pp. 113-167. Kluwer Academic Publishers, 1994.
    • (1994) Foundations of Dependable Computing: Models and Frameworks for Dependable Systems , pp. 113-167
    • Yount, C.R.1    Siewiorek, D.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.