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Volumn 78, Issue 4, 2004, Pages 617-622

Wettability and reactivity of molten silicon with various substrates

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CONTACT ANGLE; CONTAMINATION; DISSOLUTION; MOLTEN MATERIALS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SURFACE TENSION; WETTING;

EID: 1242329885     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-002-2001-8     Document Type: Article
Times cited : (85)

References (23)
  • 3
    • 1242291403 scopus 로고    scopus 로고
    • Measurements of Thermophysical Properties of Semiconductors
    • JSUP (Tokyo 1997)
    • K. Nogi: 'Measurements of Thermophysical Properties of Semiconductors'. In: Outline of the Research and Development Results, JSUP 1997 (Tokyo 1997) p. 119
    • (1997) Outline of the Research and Development Results , pp. 119
    • Nogi, K.1
  • 20
    • 0000100968 scopus 로고
    • JANAF Thermochemical Tables
    • 3rd edn.
    • M.W. Chase: 'JANAF Thermochemical Tables', 3rd edn. In: J. Phys. Ref. Data 14, 177 (1985)
    • (1985) J. Phys. Ref. Data , vol.14 , pp. 177
    • Chase, M.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.