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Volumn 4760, Issue II, 2002, Pages 1032-1039

Microscopic characterization of ablation craters produced by femtosecond laser pulses

Author keywords

Laser ablation; Laser surface modification

Indexed keywords

ATOMIC FORCE MICROSCOPY; IRRADIATION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR MATERIALS; SURFACE TREATMENT; ULTRASHORT PULSES;

EID: 18744415690     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.482062     Document Type: Conference Paper
Times cited : (6)

References (9)
  • 1
    • 0001396828 scopus 로고    scopus 로고
    • Transient states of matter during short pulse laser ablation
    • K. Sokolowski-Tinten et al., "Transient states of matter during short pulse laser ablation," Phys. Rev. Lett. 81, pp. 224-227, 1998.
    • (1998) Phys. Rev. Lett. , vol.81 , pp. 224-227
    • Sokolowski-Tinten, K.1
  • 2
    • 0033891192 scopus 로고    scopus 로고
    • Physical mechanisms of short pulse laser ablation
    • D. von der Linde and K. Sokolowski-Tinten, "Physical mechanisms of short pulse laser ablation," Appl. Surf. Sci. 154/155, pp. 1-10, 2000.
    • (2000) Appl. Surf. Sci. , vol.154-155 , pp. 1-10
    • Von der Linde, D.1    Sokolowski-Tinten, K.2
  • 3
    • 0001104089 scopus 로고    scopus 로고
    • Molecular-dynamics simulation of rarefaction waves in media that can undergo phase transitions
    • V.V. Zhakhovskij et al., "Molecular-dynamics simulation of rarefaction waves in media that can undergo phase transitions," JETP Lett. 71, pp. 167-172, 2000.
    • (2000) JETP Lett. , vol.71 , pp. 167-172
    • Zhakhovskij, V.V.1
  • 4
    • 0011837212 scopus 로고    scopus 로고
    • http://www.ilp.physik.uni-essen.de/vonderLinde/Forschung/Research.html.
  • 5
    • 0020104051 scopus 로고
    • Space-time resolved reflectivity measurements of picosecond laser-pulse induced phase transitions in (111) silicon surface layer
    • R. Yen, J.M. Liu, H. Kurz, and N. Bloembergen, "Space-time resolved reflectivity measurements of picosecond laser-pulse induced phase transitions in (111) silicon surface layer," Appl. Phys. A 27, pp. 153-160, 1982.
    • (1982) Appl. Phys. A , vol.27 , pp. 153-160
    • Yen, R.1    Liu, J.M.2    Kurz, H.3    Bloembergen, N.4
  • 6
    • 0011796262 scopus 로고    scopus 로고
    • Ph.D. Thesis, University of Essen, 1998
    • J. Bialkowski, Ph.D. Thesis, University of Essen, 1998.
    • Bialkowski, J.1
  • 7
    • 0034801234 scopus 로고    scopus 로고
    • Electron and atomic force microscopy studies of femtosecond laser machining of Si, GaAs and InP
    • A. Boroviec, M. MacKenzie,G.C. Weatherly, and H.K. Haugen, "Electron and atomic force microscopy studies of femtosecond laser machining of Si, GaAs and InP," CLEO 2001 Proc. pp. 440-441, 2001.
    • (2001) CLEO 2001 Proc. , pp. 440-441
    • Boroviec, A.1    Mackenzie, M.2    Weatherly, G.C.3    Haugen, H.K.4
  • 9
    • 0036459082 scopus 로고    scopus 로고
    • Ultrafast time-resolved interferometry at femtosecond laser excited surfaces
    • V.V. Temnov, K. Sokolowski-Tinten, and D. von der Linde, "Ultrafast time-resolved interferometry at femtosecond laser excited surfaces," CLEO 2002 Proc. pp. 32, 2002.
    • (2002) CLEO 2002 Proc. , pp. 32
    • Temnov, V.V.1    Sokolowski-Tinten, K.2    Von der Linde, D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.