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Volumn 4760, Issue II, 2002, Pages 1032-1039
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Microscopic characterization of ablation craters produced by femtosecond laser pulses
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Author keywords
Laser ablation; Laser surface modification
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
IRRADIATION;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTOR MATERIALS;
SURFACE TREATMENT;
ULTRASHORT PULSES;
LASER SURFACE MODIFICATION;
LASER ABLATION;
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EID: 18744415690
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.482062 Document Type: Conference Paper |
Times cited : (6)
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References (9)
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