Depth profiling study of in situ CdCl2 treated CdTe/CdS heterostructure with glancing angle incidence X-ray diffraction

Thin Solid Films

Volumn 450, Issue 2, 2004, Pages 255-260

  Vamsi Krishna, K ^a   Dutta, V ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

Author keywords

CdCl2 treatment; CdS CdTe; Depth profiling; Spray pyrolysis; Stress; X Ray diffraction

Indexed keywords

CADMIUM SULFIDE; DEPOSITION; DIFFUSION; GRAIN GROWTH; MICROSTRUCTURE; POLYCRYSTALLINE MATERIALS; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; TENSILE STRESS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CDCL2 TREATMENT; CDTE; DEPTH PROFILING; SPRAY PYROLYSIS;

HETEROJUNCTIONS;

EID: 1242298510     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.11.110     Document Type: Article

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