Effect of in-situ CdCl2 treatment on spray deposited CdTe films: Photoluminescence study

Physica Status Solidi (A) Applied Research

Volumn 198, Issue 2, 2003, Pages 443-446

  Vamsi Krishna, K ^a   Dutta, V ^a   Koteswara Rao, K S R ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

^b INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CADMIUM SULFIDE; ENERGY GAP; GRAIN GROWTH; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING CADMIUM TELLURIDE; SPRAYED COATINGS; SUBSTRATES; THIN FILMS;

BAND INTENSITY; CADMIUM CHLORIDE;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0141717752     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.200306639     Document Type: Article

References (22)

1. J. Britt and C. Ferekides, Appl. Phys. Lett. 62, 2851 (1993).
2. T. Aramoto and S. Kumusawa, Jpn. J. Appl. Phys. 36, 6304 (1997).
3. K. Durose, P. R. Edwards, and D. P. Halliday, J. Cryst. Growth 197, 733 (1999).
4. D. W. Niles, D. Waters, and D. Rose, Appl. Surf. Sci. 136, 221 (1998).
5. S. M. Kulify, J. Am. Chem. Soc. 83, 4916 (1961).
6. K. Vamsi Krishna, V. Dutta and D. P. Paulson, Thin Solid Films, 2003, to be published.
7. T. Schmidt, K. Lischka and W. Zulehner, Phys. Rev. B 45, 8989 (1992).
8. J. Krustok, V. Valdna, K. Hjelt, and H. Collan, J. Appl. Phys. 80, 1757 (1996).
9. F. A. Abou-Elfotouch, H. R. Moutinho, F. S. Hasoon, R. K. Ahrenkiel, D. Levi, and L. L. Kazmerski, Proc. 23rd IEEE PVSC conf. p. 491 (1993).
10. Su-Huai Wei and S. B. Zhang, Phys. Rev. B 66, 155211 (2002).
11. D. M. Hofmann, P. Omling, H. G. Grimmeiss, B. K. Meyer, K. W. Benz, and D. Sinerius, Phys. Rev. B 45, 6247 (1992).
12. N. Arami, C. Ferrari, G. Salviati, F. Bissoli, M. Zha, and L. Zanotti, Mater. Sci. Eng. B 91-92 353 (2002).
13. J. Krustok, A. Loo, and T. Piibe, J. Phys. Chem. Solids, 52, 1037 (1991).
14. K. Ohata, J. Saraie, and T. Tanaka, Japan. J. Appl. Phys. 12, 1641 (1973).
15. M. H. Aslan, W. Song, J. Tang, D. Mao, R. T. Collins, D. H. Levi, R. K. Ahrenkiel, S. C. Lindstrom, and M. B. Jonson, Mater. Res. Soc. Symp. Proc, Vol. 485, 203 (1998).
16. D. M. Oman, K. M. Dugan, J. L. Killian, V. Ceekala, C. S. Ferekides, and D. L. Morel, Appl. Phys. Lett. 67, 1896 (1995).
17. D. P. Halliday, J. M. Eggleston, and K. Durose, Thin Solid Films 322, 314 (1998).
18. C. Barrett and T. B. Massalski, Structure of Metals, 3rd ed. (Pergamon press, 1980) p. 144.
19. R. W. Vook and F. Witt, J. Vac. Sci. Technol. 2, 49, (1964).
20. P. D. Paulson and V. Dutta, Thin Solid Films, 370, 299 (2000).
21. K. Ohata, J. Saraie, and T. Tanaka, Japan. J. Appl. Phys. 12, 1198 (1973).
22. D. A. Wood, K. D. Rogers, D. W. Lane, G. J. Conibeer, and D. Parton, J. Mater. Sci. Lett. 17, 1511 (1998).