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Volumn 126, Issue 2, 2004, Pages 256-264

Accelerated thermal cycling guidelines for electronic packages in military avionics thermal environment

Author keywords

[No Author keywords available]

Indexed keywords

MICROELECTRONICS; MILITARY APPLICATIONS; MILITARY AVIATION; OBSOLESCENCE; RELIABILITY; SOLDERED JOINTS; SOLDERING ALLOYS; TELECOMMUNICATION SYSTEMS; THERMAL CYCLING;

EID: 12344322625     PISSN: 10437398     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1756150     Document Type: Article
Times cited : (9)

References (20)
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    • September
    • Suhir, E., 2002, "Accelerated Life Testing (ALT) in Microelectronics and Photonics: Its Role, Attributes, Challenges, Pitfalls, and Interaction With Qualification Tests," ASME J. Electron. Packag., 124(3), September, pp. 281-291.
    • (2002) ASME J. Electron. Packag. , vol.124 , Issue.3 , pp. 281-291
    • Suhir, E.1
  • 9
    • 0022218769 scopus 로고
    • Constitutive equations for hot-working of metals
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    • Anand, L.1
  • 10
    • 0040748904 scopus 로고    scopus 로고
    • Applying anand model to represent the viscoplastic deformation behavior of solder alloys
    • September
    • Wang, G. Z., Cheng, Z. N., Becker, K., and Wilde, J., 2001, "Applying Anand Model to Represent the Viscoplastic Deformation Behavior of Solder Alloys," ASME J. Electron. Packag., 123(3), September, pp. 247-253.
    • (2001) ASME J. Electron. Packag. , vol.123 , Issue.3 , pp. 247-253
    • Wang, G.Z.1    Cheng, Z.N.2    Becker, K.3    Wilde, J.4
  • 13
    • 0003309562 scopus 로고
    • Integrated matrix creep: Application to accelerated testing and lifetime prediction
    • J. Lau, ed., Van Nostrand Reinhold, New York
    • Knecht, S., and Fox, L., 1991, "Integrated Matrix Creep: Application to Accelerated Testing and Lifetime Prediction," Solder Joint Reliability - Theory and Applications, J. Lau, ed., Van Nostrand Reinhold, New York, pp. 508-544.
    • (1991) Solder Joint Reliability - Theory and Applications , pp. 508-544
    • Knecht, S.1    Fox, L.2
  • 16
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    • Asymmetric accelerated thermal cycles: An alternative approach to accelerated reliability assessment of microelectronic packages
    • IEEE-CPMT and IMAPS, Dec. 10-12, 2003, Singapore
    • Classe, F., and Sitaraman, S. K., 2003, "Asymmetric Accelerated Thermal Cycles: An Alternative Approach to Accelerated Reliability Assessment of Microelectronic Packages," Proceedings of EPTC 2003, 5th Electronics Packaging Technology Conference, IEEE-CPMT and IMAPS, Dec. 10-12, 2003, Singapore, pp. 81-89.
    • (2003) Proceedings of EPTC 2003, 5th Electronics Packaging Technology Conference , pp. 81-89
    • Classe, F.1    Sitaraman, S.K.2
  • 17
    • 0039486035 scopus 로고    scopus 로고
    • Impact of low temperatures on solder joint failures
    • June
    • Mirman, B., 2002, "Impact of Low Temperatures on Solder Joint Failures," ASME J. Electron. Packag., 124(2), June, pp. 135-137.
    • (2002) ASME J. Electron. Packag. , vol.124 , Issue.2 , pp. 135-137
    • Mirman, B.1
  • 18
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  • 19
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    • Damage metric-based mapping approaches for developing accelerated thermal cycling guidelines for electronic packages
    • July
    • Pucha, R. V., Pyland, J., and Sitaraman, S. K., 2001, "Damage Metric-Based Mapping Approaches for Developing Accelerated Thermal Cycling Guidelines for Electronic Packages," Int. J. Damage Mech., 10, July, pp. 214-234.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.