Photoelectronic analog-to-digital conversion: Sampling and quantizing at 100 Gs/s

IEEE Transactions on Microwave Theory and Techniques

Volumn 53, Issue 1, 2005, Pages 336-341

  Ioakeimidi, Katerina ^a,b   Leheny, Robert F ^c   Gradinaru, Stefan ^a   Bolton, Paul R ^b   Aldana, Rafael ^a   Ma, Kai ^a   Clendenin, James E ^b   Harris Jr , James S ^a   Pease, R Fabian W ^a  

^a STANFORD UNIVERSITY   (United States)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^c DEFENSE ADVANCED RESEARCH PROJECTS AGENCY   (United States)

Author keywords

Analog to digital conversion; Cathode ray tubes; Flash converters; High speed optoelectronics; Mode locked lasers; Optical sampling; Temporal jitter

Indexed keywords

BANDWIDTH; CATHODE RAY TUBES; COMMUNICATION SYSTEMS; DETECTORS; JITTER; LASER PULSES; PHOTOCONDUCTING DEVICES; SAMPLING;

FLASH CONVERTERS; HIGH-SPEED OPTOELECTRONICS; MODE-LOCKED LASERS; OPTICAL SAMPLING; TEMPORAL JITTER;

ANALOG TO DIGITAL CONVERSION;

EID: 12344316264     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2004.839923     Document Type: Conference Paper

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