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Volumn 24, Issue 3, 2004, Pages 353-372

Molecular beam mass spectrometry system for characterization of thermal plasma chemical vapor deposition

Author keywords

Chemical vapor deposition; Mass spectrometry; Thermal plasma

Indexed keywords

BORON CARBIDE; BOUNDARY LAYERS; CHEMICAL VAPOR DEPOSITION; FLUORESCENCE; GAS CHROMATOGRAPHY; MASS SPECTROMETRY; MOLECULAR BEAM EPITAXY; PLASMAS; SILICON CARBIDE; THIN FILMS;

EID: 12344295271     PISSN: 02724324     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11090-004-2273-1     Document Type: Article
Times cited : (10)

References (26)
  • 12
    • 0003158036 scopus 로고
    • (G. Scoles, ed.), Oxford University, New York, Chap. 2
    • D. R. Miller, Atomic and Molecular Beam Methods, Vol. 1 (G. Scoles, ed.), Oxford University, New York, 1988, Chap. 2.
    • (1988) Atomic and Molecular Beam Methods , vol.1
    • Miller, D.R.1
  • 22
    • 0002369990 scopus 로고
    • (J. J. de Leeuw, ed.), Academic Press, New York
    • H. Ashkenas and F. S. Sherman, Rarefied Gas Dynamics, Vol. 2 (J. J. de Leeuw, ed.), Academic Press, New York, 1966, pp. 84-105.
    • (1966) Rarefied Gas Dynamics , vol.2 , pp. 84-105
    • Ashkenas, H.1    Sherman, F.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.