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Volumn 24, Issue 3, 2004, Pages 353-372
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Molecular beam mass spectrometry system for characterization of thermal plasma chemical vapor deposition
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Author keywords
Chemical vapor deposition; Mass spectrometry; Thermal plasma
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Indexed keywords
BORON CARBIDE;
BOUNDARY LAYERS;
CHEMICAL VAPOR DEPOSITION;
FLUORESCENCE;
GAS CHROMATOGRAPHY;
MASS SPECTROMETRY;
MOLECULAR BEAM EPITAXY;
PLASMAS;
SILICON CARBIDE;
THIN FILMS;
MASS DISCRIMINATION;
MOLECULAR BEAM MASS SPECTROMETRY (MBMS);
THERMAL PLASMA;
THRESHOLD IONIZATION;
GAS DYNAMICS;
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EID: 12344295271
PISSN: 02724324
EISSN: None
Source Type: Journal
DOI: 10.1007/s11090-004-2273-1 Document Type: Article |
Times cited : (10)
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References (26)
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