Interpretation of Rent's rule for ultralarge-scale integrated circuit designs, with an application to wirelength distribution models

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 12, Issue 12, 2004, Pages 1330-1347

  Lanzerotti, Mary Yvonne ^a   Fiorenza, Giovanni ^a   Rand, R A ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Circuit; Rent; Ultralarge scale integration (ULSI); Very large scale integration (VLSI); Wirelength distribution

Indexed keywords

COMPUTER HARDWARE; CONTROL THEORY; INTEGRATED CIRCUIT LAYOUT; LOGIC CIRCUITS; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; SERVERS;

COMPUTER COMPONENTS; DAVIS MODEL; RENT; WIRELENGTH DISTRIBUTION;

ULSI CIRCUITS;

EID: 12344261796     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2004.837990     Document Type: Article

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