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Volumn 274, Issue 3-4, 2005, Pages 458-463
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Influence of Ar/O2 gas ratios on the crystal quality and band gap of Zn1-xCdxO thin films
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Author keywords
A1. Ar O2 ratio; A1. Band gap; A1. Crystal quality; B1. Zn 1 xCdxO
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Indexed keywords
ARGON;
ATOMIC FORCE MICROSCOPY;
DEPOSITION;
GLASS;
LIGHT ABSORPTION;
LIGHT EMITTING DIODES;
MAGNETRON SPUTTERING;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
X RAY DIFFRACTION ANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
ZINC COMPOUNDS;
AR/O2 RATIO;
BAND GAP;
CRYSTAL QUALITY;
ZN1-XCDXO;
THIN FILMS;
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EID: 12244300952
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2004.10.043 Document Type: Article |
Times cited : (9)
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References (16)
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