Structural characterization and photoluminescent properties of Zn1-xMgxO films on silicon

Chinese Physics Letters

Volumn 19, Issue 9, 2002, Pages 1350-1352

  Zou, Lu ^a   Ye, Zhi Zhen ^a   Huang, Jing Yun ^a   Zhao, Bing Hui ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; PHASE SEPARATION; PULSED LASER DEPOSITION; SILICON; SUBSTRATES; X RAY DIFFRACTION;

ATOMIC-FORCE-MICROSCOPY; C AXIS ORIENTED; CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; CRYSTAL GRAIN SIZE; PHOTO-LUMINESCENT PROPERTIES; PULSED-LASER DEPOSITION; STRUCTURAL CHARACTERIZATION; SUBSTRATES TEMPERATURE; VARIOUS SUBSTRATES; X-RAY DIFFRACTION SPECTRUM;

ZINC COMPOUNDS;

EID: 0036712580     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/19/9/341     Document Type: Article

References (16)