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Volumn 241, Issue 1-2 SPEC. ISS., 2005, Pages 174-178
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Pattern formation induced by Ar + sputtering on Au(1 1 1)
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Author keywords
Scanning tunneling microscopy; Sputtering; Surface diffusion; Surface morphology
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
CHARACTERIZATION;
DIFFUSION;
GOLD;
ION BOMBARDMENT;
IONS;
LOW ENERGY ELECTRON DIFFRACTION;
METALLIC FILMS;
MORPHOLOGY;
OPTIMIZATION;
SCANNING TUNNELING MICROSCOPY;
SPUTTERING;
SURFACE CHEMISTRY;
SURFACE TOPOGRAPHY;
ION SPUTTERING;
MAGNETIC STORAGE TECHNOLOGY;
MONOVACANCIES;
SURFACE DIFFUSION;
ARGON;
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EID: 12244271090
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2004.09.057 Document Type: Conference Paper |
Times cited : (7)
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References (16)
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