Morphology of sputtering damage on Cu (111) studied by scanning tunneling microscopy

Surface Science

Volumn 388, Issue 1-3, 1997, Pages 212-219

  Naumann, J ^a,c   Osing, J ^b   Quinn, A J ^b,d   Shvets, I V ^b  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b TRINITY COLLEGE DUBLIN   (Ireland)

^c UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^d RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

Author keywords

Copper; Ion damage; Low index single crystal surfaces; Scanning tunneling microscopy; Sputtering; Surface diffusion

Indexed keywords

ARGON; CRYSTAL ORIENTATION; DIFFUSION IN SOLIDS; ION BOMBARDMENT; MASS TRANSFER; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; SPUTTERING; SURFACE STRUCTURE; THERMAL EFFECTS;

LOW INDEX SINGLE CRYSTALS;

COPPER;

EID: 0031244933     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00397-X     Document Type: Article

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