SCOPUS 정보 검색 플랫폼

Volumn 241, Issue 1-2 SPEC. ISS., 2005, Pages 107-112

Characterization of nanometer-sized dendritic form structures fabricated on insulator substrates with an electron-beam-induced deposition in a TEM

Author keywords

Dendrite; Electron beam induced deposition; Nanofabrication; Nanostructure; TEM

Indexed keywords

ALUMINA; CHARACTERIZATION; CRYSTALS; DEPOSITION; ELECTRON BEAMS; NANOTECHNOLOGY; TRANSMISSION ELECTRON MICROSCOPY;

DENDRITE; ELECTRON-BEAM-INDUCED DEPOSITION (EBID); FIELD EMISSION GUNS; NANOSTRUCTURE;

NANOSTRUCTURED MATERIALS;

EID: 12244251466 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2004.09.026 Document Type: Conference Paper

Times cited : (10)

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