-
1
-
-
0035914060
-
-
K. W. Hipps, Science 2001, 294, 536.
-
(2001)
Science
, vol.294
, pp. 536
-
-
Hipps, K.W.1
-
2
-
-
1842413643
-
-
M. A. Reed, C. Zhou, C. J. Muller, T. P. Burgin, J. M. Tour, Science 1997, 278, 252.
-
(1997)
Science
, vol.278
, pp. 252
-
-
Reed, M.A.1
Zhou, C.2
Muller, C.J.3
Burgin, T.P.4
Tour, J.M.5
-
3
-
-
0000795025
-
-
C. Kergueris, J.-P. Bourgoin, S. Palacin, C. Esteve, C. Urbina, M. Magoga, C. Joachim, Phys. Rev. B: Condens. Matter Mater. Phys. 1999, 59, 12 505.
-
(1999)
Phys. Rev. B: Condens. Matter Mater. Phys.
, vol.59
, pp. 12505
-
-
Kergueris, C.1
Bourgoin, J.-P.2
Palacin, S.3
Esteve, C.4
Urbina, C.5
Magoga, M.6
Joachim, C.7
-
4
-
-
0033584805
-
-
J. Chen, M. A. Reed, A. M. Rawlett, J. M. Tour, Science 1999, 286, 1550.
-
(1999)
Science
, vol.286
, pp. 1550
-
-
Chen, J.1
Reed, M.A.2
Rawlett, A.M.3
Tour, J.M.4
-
5
-
-
4243090463
-
-
R. P. Andres, T. Bein, M. Dorogi, S. Feng, J. I. Henderson, C. P. Kubiak, W. Mahoney, R. G. Osifchin, R. Reifenberger, Science 1996, 272, 1323.
-
(1996)
Science
, vol.272
, pp. 1323
-
-
Andres, R.P.1
Bein, T.2
Dorogi, M.3
Feng, S.4
Henderson, J.I.5
Kubiak, C.P.6
Mahoney, W.7
Osifchin, R.G.8
Reifenberger, R.9
-
7
-
-
0037417966
-
-
J. Zheng, Y. Zhou, X. Li, Y. Ji, T. Lu, R. Gu, Langmuir 2003, 19, 632.
-
(2003)
Langmuir
, vol.19
, pp. 632
-
-
Zheng, J.1
Zhou, Y.2
Li, X.3
Ji, Y.4
Lu, T.5
Gu, R.6
-
8
-
-
0034597775
-
-
D. I. Gittins, D. Bethell, D. J. Schiffrin, R. J. Nichols, Nature 2000, 408, 67.
-
(2000)
Nature
, vol.408
, pp. 67
-
-
Gittins, D.I.1
Bethell, D.2
Schiffrin, D.J.3
Nichols, R.J.4
-
10
-
-
0000691417
-
-
E. L. Smith, A. A. Alves, J. W. Anderegg, M. D. Porter, L. M. Siperko, Langmuir 1992, 8, 2707.
-
(1992)
Langmuir
, vol.8
, pp. 2707
-
-
Smith, E.L.1
Alves, A.A.2
Anderegg, J.W.3
Porter, M.D.4
Siperko, L.M.5
-
11
-
-
0031258956
-
-
M. Nishizawa, T. Sunagawa, H. Yoneyama, Langmuir 1997, 13, 5215.
-
(1997)
Langmuir
, vol.13
, pp. 5215
-
-
Nishizawa, M.1
Sunagawa, T.2
Yoneyama, H.3
-
12
-
-
0033343473
-
-
H. Hagenström, M. A. Schneeweiß, D. M. Kolb, Langmuir 1999, 15, 7802.
-
(1999)
Langmuir
, vol.15
, pp. 7802
-
-
Hagenström, H.1
Schneeweiß, M.A.2
Kolb, D.M.3
-
13
-
-
0030197378
-
-
S. E. Gilbert, O. Cavalleri, K. Kern, J. Phys. Chem. 1996, 100, 12123.
-
(1996)
J. Phys. Chem.
, vol.100
, pp. 12123
-
-
Gilbert, S.E.1
Cavalleri, O.2
Kern, K.3
-
14
-
-
0032477657
-
-
F. P. Zamborini, J. K. Campbell, R. M. Crooks, Langmuir 1998, 14, 640.
-
(1998)
Langmuir
, vol.14
, pp. 640
-
-
Zamborini, F.P.1
Campbell, J.K.2
Crooks, R.M.3
-
15
-
-
0033340128
-
-
D. Oyamatsu, S. Kuwabata, H. Yoneyama, J. Electroanal. Chem. 1999, 473, 59.
-
(1999)
J. Electroanal. Chem.
, vol.473
, pp. 59
-
-
Oyamatsu, D.1
Kuwabata, S.2
Yoneyama, H.3
-
16
-
-
2142784150
-
-
O. Cavalleri, A. Bittner, H. Kind, K. Kern, Z. Phys. Chem. 1999, 208, 107.
-
(1999)
Z. Phys. Chem.
, vol.208
, pp. 107
-
-
Cavalleri, O.1
Bittner, A.2
Kind, H.3
Kern, K.4
-
18
-
-
0001315853
-
-
H. Hagenström, M. A. Schneeweiß, D. M. Kolb, Electrochim. Acta 1999, 45, 1141.
-
(1999)
Electrochim. Acta
, vol.45
, pp. 1141
-
-
Hagenström, H.1
Schneeweiß, M.A.2
Kolb, D.M.3
-
20
-
-
0033366304
-
-
M. A. Schneeweiß, H. Hagenström, M. J. Esplandiu, D. M. Kolb, Appl. Phys. A: Mater. Sci. Process. 1999, 69, 537.
-
(1999)
Appl. Phys. A: Mater. Sci. Process.
, vol.69
, pp. 537
-
-
Schneeweiß, M.A.1
Hagenström, H.2
Esplandiu, M.J.3
Kolb, D.M.4
-
22
-
-
0000880044
-
-
H. Kind, A. M. Bittner, O. Cavalleri, K. Kern, T. Greber, J. Phys. Chem. B 1998, 102, 7582.
-
(1998)
J. Phys. Chem. B
, vol.102
, pp. 7582
-
-
Kind, H.1
Bittner, A.M.2
Cavalleri, O.3
Kern, K.4
Greber, T.5
-
23
-
-
0028336573
-
-
W. J. Dressick, C. S. Dulcey, J. H. Georger, G. S. Calabrese, J. M. Calvert, J. Electrochem. Soc. 1994, 141, 210.
-
(1994)
J. Electrochem. Soc.
, vol.141
, pp. 210
-
-
Dressick, W.J.1
Dulcey, C.S.2
Georger, J.H.3
Calabrese, G.S.4
Calvert, J.M.5
-
25
-
-
2942534209
-
-
W.-P. Zhou, T. Baunach, V. Ivanova, D. M. Kolb, Langmuir 2004, 20, 4590.
-
(2004)
Langmuir
, vol.20
, pp. 4590
-
-
Zhou, W.-P.1
Baunach, T.2
Ivanova, V.3
Kolb, D.M.4
-
26
-
-
1842791800
-
-
T. Baunach, V. Ivanova, D. A. Scherson, D. M. Kolb, Langmuir 2004, 20, 2797.
-
(2004)
Langmuir
, vol.20
, pp. 2797
-
-
Baunach, T.1
Ivanova, V.2
Scherson, D.A.3
Kolb, D.M.4
-
28
-
-
0033119349
-
-
H.-Z. Yu, N. Xia, Z.-F. Liu, Anal. Chem. 1999, 71, 1354.
-
(1999)
Anal. Chem.
, vol.71
, pp. 1354
-
-
Yu, H.-Z.1
Xia, N.2
Liu, Z.-F.3
-
30
-
-
0004234072
-
-
(Eds: M. Schlesinger, M. Paunovic), Wiley, New York
-
J. A. Abys, C. A. Dullaghan, in Modern Electroplating, 4th ed. (Eds: M. Schlesinger, M. Paunovic), Wiley, New York 2000, p. 483.
-
(2000)
Modern Electroplating, 4th Ed.
, pp. 483
-
-
Abys, J.A.1
Dullaghan, C.A.2
-
32
-
-
0000772407
-
-
R. Eskenazi, J. Raskovan, R. Levitus, J. Inorg. Nucl. Chem. 1966, 28, 521.
-
(1966)
J. Inorg. Nucl. Chem.
, vol.28
, pp. 521
-
-
Eskenazi, R.1
Raskovan, J.2
Levitus, R.3
-
34
-
-
11444251117
-
-
J. Tang, M. Petri, R. Hoyer, L. A. Kibler, D. M. Kolb, unpublished
-
J. Tang, M. Petri, R. Hoyer, L. A. Kibler, D. M. Kolb, unpublished.
-
-
-
-
35
-
-
11444254987
-
-
note
-
This can safely be concluded from a measured step height which approximately corresponds to the size of a palladium atom. The observed small deviation might be due to a tip penetration into the organic layer, or to electronic effects which can also change the topographic height.
-
-
-
-
37
-
-
35949020685
-
-
G. K. Wertheim, S. B. DiCenzo, S. E. Youngquist, Phys. Rev. Lett. 1983, 51, 2310.
-
(1983)
Phys. Rev. Lett.
, vol.51
, pp. 2310
-
-
Wertheim, G.K.1
Dicenzo, S.B.2
Youngquist, S.E.3
-
38
-
-
4244072491
-
-
H. Hövel, B. Grimm, M. Pollmann, B. Reihl, Phys. Rev. Lett. 1998, 81, 4608.
-
(1998)
Phys. Rev. Lett.
, vol.81
, pp. 4608
-
-
Hövel, H.1
Grimm, B.2
Pollmann, M.3
Reihl, B.4
-
40
-
-
4243629719
-
-
T.-S. Lin, W. J. Partin, G. M. Damminga, T. M. Parrill, W.-J. Lee, Y.-W. Chung, Surf Sci. 1987, 183, 113.
-
(1987)
Surf Sci.
, vol.183
, pp. 113
-
-
Lin, T.-S.1
Partin, W.J.2
Damminga, G.M.3
Parrill, T.M.4
Lee, W.-J.5
Chung, Y.-W.6
-
41
-
-
0033585523
-
-
W. F. Bergerson, J. A. Mulder, R. P. Hsung, X.-Y. Zhu, J. Am. Chem. Soc. 1999, 121, 454.
-
(1999)
J. Am. Chem. Soc.
, vol.121
, pp. 454
-
-
Bergerson, W.F.1
Mulder, J.A.2
Hsung, R.P.3
Zhu, X.-Y.4
-
42
-
-
0003828439
-
-
Wiley, Chichester, UK
-
Practical Surface Analysis, 2nd ed., (Eds: D. Briggs, M. P. Seah), Wiley, Chichester, UK 1996, Vol. 1.
-
(1996)
Practical Surface Analysis, 2nd Ed.
, vol.1
-
-
Briggs, D.1
Seah, M.P.2
-
43
-
-
0000992383
-
-
P. E. Laibinis, C. D. Bain, G. M. Whitesides, J. Phys. Chem. 1991, 95, 7017.
-
(1991)
J. Phys. Chem.
, vol.95
, pp. 7017
-
-
Laibinis, P.E.1
Bain, C.D.2
Whitesides, G.M.3
|