Critical comparison of recent analysis methods of X-ray and neutron reflectivity data

Journal De Physique. IV : JP

Volumn 12, Issue 6, 2002, Pages

  Van Der Lee, A ^a  

^a UNIVERSITÉ DE MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CURVE FITTING; LEAST SQUARES APPROXIMATIONS; NEUTRON REFLECTION; PROBLEM SOLVING; X RAY ANALYSIS;

DENSITY PROFILES; LEAST-SQUARES FITTING METHODS; NEUTRON REFLECTIVITY DATA;

THIN FILMS;

EID: 1142290344     PISSN: 11554339     EISSN: 17647177     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:20020234     Document Type: Conference Paper

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