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Volumn 73, Issue 1, 2004, Pages 79-87

Material dependence of electronic sputtering induced by MeV-energy heavy ions

Author keywords

Cluster emission; Emission energy; Multiply charged ions; Secondary ion; Sputtering; Yield

Indexed keywords

COAGULATION; ELECTRIC CHARGE; ELECTRIC INSULATORS; ELECTRON EMISSION; ELECTRON ENERGY LOSS SPECTROSCOPY; HYDROGENATION; POSITIVE IONS; REACTION KINETICS; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTOR MATERIALS; SPUTTERING;

EID: 1142280290     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2003.12.026     Document Type: Conference Paper
Times cited : (6)

References (40)
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    • Behrisch R, Wittmaack K, editors, Berlin: Springer and references cited therein
    • Ming L, Yu. In: Behrisch R, Wittmaack K, editors. Sputtering by particle bombardment III, Berlin: Springer; 1991. p. 91, and references cited therein.
    • (1991) Sputtering by Particle Bombardment III , pp. 91
    • Ming, L.Yu.1
  • 9
    • 0009588707 scopus 로고    scopus 로고
    • Ziegler J.F. Handbook of stopping cross section for energetic ions in all elements. 1980;Pergamon, New York, Biersack JP, Ziegler JF. TRIM code.
    • TRIM Code
    • Biersack, J.P.1    Ziegler, J.F.2
  • 10
    • 0000250437 scopus 로고
    • Behrisch R, Wittmaack K (Eds). Berlin: Springer and references cited therein
    • Sundqvist BUR. In: Behrisch R, Wittmaack K (Eds). Sputtering by particle bombardment III. Berlin: Springer; 1991. p. 257, and references cited therein.
    • (1991) Sputtering by Particle Bombardment III , pp. 257
    • Sundqvist, B.U.R.1
  • 24
    • 0001725957 scopus 로고
    • Šroubek Z. Phys Rev B. 25:1982;6046 Šroubek Z. Nucl Instrum Methods. 194:1982;533.
    • (1982) Phys Rev B , vol.25 , pp. 6046
    • Šroubek, Z.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.