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Volumn 193, Issue 1-4, 2002, Pages 745-750

Material-dependent emission mechanism of secondary atomic ions from solids under MeV-energy heavy ion bombardment

Author keywords

Coulomb repulsion; Electronic sputtering; Singly and multiply charged secondary ion

Indexed keywords

ELECTRIC CHARGE; GALLIUM COMPOUNDS; HEAVY IONS; NEGATIVE IONS; SPUTTERING; TARGETS;

EID: 0036608981     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)00897-2     Document Type: Article
Times cited : (11)

References (27)
  • 10
    • 85021430866 scopus 로고    scopus 로고
    • Murata Mgf. Co., Ltd. in Japan


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.