Postgrowth nondestructive characterization of dilute-nitride VCSELs using electroreflectance spectroscopy

IEEE Photonics Technology Letters

Volumn 15, Issue 8, 2003, Pages 1026-1028

  Choulis, S A ^a   Hosea, T J C ^b   Ghosh, S ^c   Klar, P J ^d   Hofmann, M ^e  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b UNIVERSITY OF SURREY   (United Kingdom)

^c TATA INSTITUTE OF FUNDAMENTAL RESEARCH   (India)

^d PHILIPPS UNIVERSITY MARBURG   (Germany)

^e RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

Cavity resonators; GaInNAs; Material testing; Optical spectroscopy; Quantum well devices; Reflection; Resonance; Surface emitting lasers; Transitions

Indexed keywords

LASER APPLICATIONS; NONDESTRUCTIVE EXAMINATION; OPTICAL PUMPING; SEMICONDUCTOR QUANTUM WELLS;

ELECTROREFLECTANCE SPECTROSCOPY;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0043026722     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2003.815364     Document Type: Article

References (10)

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