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Volumn 148, Issue 1, 2001, Pages 69-73

Nondestructive spectroscopic characterisation of visible resonant cavity light emitting diode structures

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROLUMINESCENCE; LIGHT REFLECTION; NONDESTRUCTIVE EXAMINATION; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS; SPECTROSCOPY;

EID: 0035247704     PISSN: 13502433     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-opt:20010037     Document Type: Article
Times cited : (12)

References (15)
  • 9
    • 0000545279 scopus 로고    scopus 로고
    • Non-destructive electroluminescence characterisation of as-grown semiconductor optoelectronic device structures using indium tin oxide coated electrodes
    • (2000) Rev. Sci. Instrument , vol.71 , pp. 1911-1912
    • Ghosh, S.1    Hosea, T.J.C.2
  • 13
    • 26744464488 scopus 로고
    • Third-derivative modulation spectroscopy with low field electroreflectance
    • (1973) Surf. Sci. , vol.37 , pp. 418-442
    • Aspnes, D.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.