Illumination effects in holographic imaging of the electrostatic potential of defects and pn junctions in transmission electron microscopy [61]

Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 16, 2004, Pages 1-8

  Houben, L ^a   Luysberg, M ^a   Brammer, T ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ELECTRIC POTENTIAL; ELECTRON; ELECTRON BEAM; HOLOGRAPHY; ILLUMINATION; MATHEMATICAL COMPUTING; SEMICONDUCTOR; SIMULATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 11244300749     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.165313     Document Type: Article

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