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Volumn 34, Issue 12, 2004, Pages 1215-1219

Water diffusion coefficients during copper electropolishing

Author keywords

Chronoamperometry; Cottrell analysis; Diffusion coefficient; Electrodissolution; Electropolishing; Levich analysis; Planarization

Indexed keywords

COPPER; CYCLIC VOLTAMMETRY; DIFFUSION; DISSOLUTION; ELECTROCHEMICAL ELECTRODES; ELECTROLYTES; PHOSPHORIC ACID; VISCOSITY; WATER;

EID: 10844244617     PISSN: 0021891X     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10800-004-3303-7     Document Type: Article
Times cited : (22)

References (22)
  • 6
    • 10844292899 scopus 로고    scopus 로고
    • U.S. Patent # 6,395,152
    • H. Wang, U.S. Patent # 6,395,152.
    • Wang, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.