Carbon nanotube field emitter arrays having an electron beam focusing structure

Applied Physics Letters

Volumn 84, Issue 6, 2004, Pages 1022-1024

  Choi, Jun Hee ^a   Zoulkarneev, Andrei R ^a   Jin, Yong Wan ^a   Park, Young Jun ^a   Chung, Deuk Seok ^a   Song, Byung Kwon ^a   Han, In Taek ^a   Lee, Hang Woo ^a   Park, Sang Hyun ^a   Kang, Ho Suk ^a   Kim, Ha Jong ^a   Kim, Jung Woo ^a   Jung, Jae Eun ^a   Kim, Jong Min ^a   Baek, Hong Gu ^b   Yu, Se Gi ^c  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^b Yonsei University   (South Korea)

^c Hankuk University of Foreign Studies   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; ELECTRON BEAMS; FOCUSING; SILICA; VOLTAGE MEASUREMENT;

FIELD EMITTER ARRAYS; GATE INSULATOR; OVERFOCUSING EFFECT;

CARBON NANOTUBES;

EID: 10744233545     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1645315     Document Type: Article

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