Laser Beam Based ESD Defect Localization In ICs

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 2002, Pages 543-551

  Beaudoin, Félix ^a   Perdu, Philippe ^a   Desplats, Romain ^a   Doche, Emmanuel ^b   Wislez, Alain ^b   Beauchêne, Thomas ^c   Lewis, Dean ^c   Carisetti, Dominique ^d   Trémouilles, David ^e   Bafleur, Marise ^e  

^a CNES   (France)

^b Bureau Veritas LCIE   (France)

^c UNIVERSITÉ BORDEAUX 1   (France)

^d THALES RESEARCH AND TECHNOLOGY   (France)

^e LAAS CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTROSTATICS; INDUCED CURRENTS; LASER BEAMS; NONDESTRUCTIVE EXAMINATION; SEMICONDUCTING GALLIUM ARSENIDE; SILICON COMPOUNDS; THERMOCOUPLES;

OPTICAL BEAMS; THERMAL LASER STIMULATION;

CMOS INTEGRATED CIRCUITS;

EID: 10744230762     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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