Front side and backside OBIT mappings applied to single event transient testing

Microelectronics Reliability

Volumn 41, Issue 9-10, 2001, Pages 1471-1476

  Lewis, D ^a   Pouget, V ^a   Beauchene T ^a   Lapuyade, H ^a   Fouillat, P ^a   Touboul, A ^a   Beaudoin, F ^b   Perdu, P ^b  

^a UNIVERSITÉ BORDEAUX 1   (France)

^b CNES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE PROCESSING; ULTRASHORT PULSES; VLSI CIRCUITS;

OPTICAL BEAM INDUCED TRANSIENT (OBIT);

INTEGRATED CIRCUIT TESTING;

EID: 0035456693     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(01)00198-6     Document Type: Article

References (6)

1. Stamm U, Bergner H, Hempem K and Krause A. Techniques for Picosecond OBIC Measurements on ICs, Microelectronic Engineering., vol 16, 275-286, 1992
2. Pouget V, Lapuyade H, Lewis D, Fouillat P , Sarger L. Elaboration of a New Pulsed Laser System for SEE Testing. Proc. of 4th IEEE International On-Line Testing Workshop, Capri (Italy), 4-6 July 1998.
3. Pouget V, Lewis D, Lapuyade H, Briand R, Fouillat P, Sarger L,. Calvet M-C. Validation of Radiation Hardened Designs by Pulsed Laser Testing and SPICE Analysis. Microelectronics Reliability, vol. 39, p. 931-935, 1999.
4. Pouget V, Fouillat P, Lewis D, Lapuyade H, Darracq F, Touboul A. Laser Cross Section Measurement for the Evaluation of Single-Event Effects in Integrated Circuits. Microelectronics Reliability, vol. 40, p. 1371-1375, 2000.
5. Lewis D, Pouget V, Beaudoin F, Perdu P, Lapuyade H., Fouillat P., Touboul A. Backside Laser Testing of ICs for SET Sensitivity Evaluation, proc of NSREC 2001, Vancouver, Canada.
6. Adell P, Schrimpf RD, Barnaby HJ, Marec R, Chatry C, Calvel P, Barillot C, Moi O. Analysi of single event transient in analog circuits. IEEE Trans. Nucl. Sc., vol 47-6, 2616-2623, 2000.