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Volumn 25, Issue 2, 2004, Pages 97-106

Study of the structure of PZT films: Influence of the thermal treatments. Advanced ferroelectric characterisation

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELD MEASUREMENT; ELECTRIC PROPERTIES; FERROELECTRICITY; HEAT TREATMENT; HYSTERESIS; MORPHOLOGY; PRECIPITATION (CHEMICAL); PYROLYSIS; STRUCTURE (COMPOSITION); THERMOGRAVIMETRIC ANALYSIS; THIN FILMS;

EID: 10744226629     PISSN: 12860042     EISSN: None     Source Type: Journal    
DOI: 10.1051/epjap:2004002     Document Type: Article
Times cited : (1)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.