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Volumn 25, Issue 2, 2004, Pages 97-106
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Study of the structure of PZT films: Influence of the thermal treatments. Advanced ferroelectric characterisation
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELECTRIC FIELD MEASUREMENT;
ELECTRIC PROPERTIES;
FERROELECTRICITY;
HEAT TREATMENT;
HYSTERESIS;
MORPHOLOGY;
PRECIPITATION (CHEMICAL);
PYROLYSIS;
STRUCTURE (COMPOSITION);
THERMOGRAVIMETRIC ANALYSIS;
THIN FILMS;
DOMAIN STRUCTURE;
ELECTRIC FIELD STRENGTH;
LEAD ZIRCO-TITANATE;
PREISACH DENSITY;
SOL-GEL PROCESSING;
SEMICONDUCTING LEAD COMPOUNDS;
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EID: 10744226629
PISSN: 12860042
EISSN: None
Source Type: Journal
DOI: 10.1051/epjap:2004002 Document Type: Article |
Times cited : (1)
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References (22)
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