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Volumn 36, Issue 1-2, 2004, Pages 35-44

On the evolution of surface morphology of polysilicon MEMS structures during fatigue

Author keywords

Fatigue; Linear stability analysis; Polysilicon MEMS; Stress assisted dissolution; Surface reaction; Surface topology evolution

Indexed keywords

DISSOLUTION; FATIGUE OF MATERIALS; FINITE ELEMENT METHOD; MORPHOLOGY; NUCLEATION; POLYSILICON; STRESS ANALYSIS;

EID: 10744220430     PISSN: 01676636     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-6636(03)00029-2     Document Type: Conference Paper
Times cited : (37)

References (22)
  • 1
    • 8844257320 scopus 로고    scopus 로고
    • Surface topology and fatigue in Si MEMS structures
    • C. Muhlstein, & S.B. Brown. West Conshohocken, PA: American Society for Testing and Materials
    • Allameh S., Gally B., Brown S.B., Soboyejo W.O. Surface topology and fatigue in Si MEMS structures. Muhlstein C., Brown S.B. Mechanical Properties of Structural Films, STP 1413. 2000;American Society for Testing and Materials, West Conshohocken, PA.
    • (2000) Mechanical Properties of Structural Films , vol.STP 1413
    • Allameh, S.1    Gally, B.2    Brown, S.B.3    Soboyejo, W.O.4
  • 3
    • 0027149044 scopus 로고
    • Measurement of slow crack growth in silicon and nickel micromechanical devices
    • Fort Lauderdale, FL, February 7-10, p. 99
    • Brown, S.B., Povuk, G., Connally, J., 1993. Measurement of slow crack growth in silicon and nickel micromechanical devices. In: Proceedings of MEMS-93, Fort Lauderdale, FL, February 7-10, p. 99.
    • (1993) Proceedings of MEMS-93 , pp. 99
    • Brown, S.B.1    Povuk, G.2    Connally, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.