Towards terahertz near-field microscopy

Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 362, Issue 1815, 2004, Pages 315-321

  Van der Valk, N C J ^a   Planken, P C M ^a   Zhang, X C ^b   Withington, S ^c   Havenith, M ^d   Unterrainer, K ^e   Faist, J ^f   Van der Weide, D ^g   Johnston, M ^h   Newnham, D ⁱ   Roskos, H ^j  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^d RUHR UNIVERSITY BOCHUM   (Germany)

^e VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^f UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^g Wisconsin Electric Machines and Power Electronics Consortium   (United States)

^h UNIVERSITY OF OXFORD   (United Kingdom)

ⁱ Johann Wolfgang Goethe Univ ^*

^j GOETHE UNIVERSITY   (Germany)

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Author keywords

Near field; Terahertz imaging; Time domain spectroscopy

Indexed keywords

EID: 10744219509     PISSN: 1364503X     EISSN: None     Source Type: Journal    
DOI: 10.1098/rsta.2003.1316     Document Type: Article

References (7)

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