Towards terahertz near-field microscopy

Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 362, Issue 1815, 2004, Pages 315-321

  Van der Valk, N C J ^a   Planken, P C M ^a   Zhang, X C ^b   Withington, S ^c   Havenith, M ^d   Unterrainer, K ^e   Faist, J ^f   Van der Weide, D ^g   Johnston, M ^h   Newnham, D ⁱ   Roskos, H ^j  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^d RUHR UNIVERSITY BOCHUM   (Germany)

^e VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^f UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^g University of Wisconsin Madison   (United States)

^h UNIVERSITY OF OXFORD   (United Kingdom)

ⁱ Johann Wolfgang Goethe Univ ^*

^j GOETHE UNIVERSITY   (Germany)

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Author keywords

Near field; Terahertz imaging; Time domain spectroscopy

Indexed keywords

EID: 10744219509     PISSN: 1364503X     EISSN: None     Source Type: Journal    
DOI: 10.1098/rsta.2003.1316     Document Type: Article

References (7)

1. Chen, Q. & Zhang, X.-C. 2001 IEEE J. Select. Topics Quant. Electron. 7, 608.
2. Knoll, B. & Keilmann, F. 2000 Opt. Commun. 182, 321.
3. Mitrofanov, O., Brener, I., Harel, R., Wynn, J. D., Pfeiffer, L. N., West, K. W. & Federici, J. 2000 Appl. Phys. Lett. 77, 3496.
4. Mittleman, D. M., Jacobsen, R. H. & NUSS, M. C. 1996 IEEE J. Select. Topics Quant. Electron. 2, 679.
5. van der Valk, N. C. J. & Planken, P. C. M. 2002 Appl. Phys. Lett. 81, 1558.
6. Wynne, K., Carey, J. J., Zawadzka, J. & Jaroszynski, D. A. 2000 Opt. Commun. 176, 429.
7. Zhao, G., Schouten, R. N., van der Valk, N., Wenckebach, W. Th. & Planken, P. C. M. 2002 Rev. Scient. Instrum. 73, 1715.