Wirelike growth of self-assembled hafnium suicides: Oxide mediated epitaxy

Applied Surface Science

Volumn 239, Issue 3-4, 2005, Pages 268-272

  Lee, Jung Ho ^a  

^a Hanyang University   (South Korea)

Author keywords

Hafnium; Interfaces; Scanning tunneling microscopy; X ray photoelectron spectroscopy

Indexed keywords

ANNEALING; EPITAXIAL GROWTH; EVAPORATION; INTERFACES (MATERIALS); MONOLAYERS; NUCLEATION; SCANNING TUNNELING MICROSCOPY; SELF ASSEMBLY; SILICA; SILICATES; X RAY PHOTOELECTRON SPECTROSCOPY;

EVAPORATION RATE; HAFNIUM SILICIDES; OXIDE MEDIATED EPITAXY (OME); SILICIDATION;

HAFNIUM COMPOUNDS;

EID: 10644262134     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.06.013     Document Type: Article

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