Incoming metrology of segmented x-ray mandrels at MSFC

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5494, Issue , 2004, Pages 447-458

  Gubarev, Mikhail V ^a   O'Dell, Stephen L ^a   Kester, Thomas J ^a   Lehner, David L ^a   Jones, William D ^a   Smithers, Martin E ^a   Content, David A ^b   Reid, Paul B ^c  

^a NASA MARSHALL SPACE FLIGHT CENTER   (United States)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

^c HARVARD SMITHSONIAN CENTER FOR ASTROPHYSICS   (United States)

Author keywords

Figure measurements; Long trace profilometer; Metrology; X ray optics

Indexed keywords

ASTROPHYSICS; IMAGE SEGMENTATION; LIGHT REFLECTION; MIRRORS; ROUGHNESS MEASUREMENT; SURFACE ROUGHNESS; X RAY OPTICS;

FIGURE MEASUREMENTS; LONG-TRACE PROFILOMETER; X-RAY MANDRELS;

SPACE TELESCOPES;

EID: 10444286889     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.551902     Document Type: Conference Paper

References (7)

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