Numerical investigation of ultrashort laser damage in semiconductors

International Journal of Heat and Mass Transfer

Volumn 48, Issue 3-4, 2005, Pages 501-509

  Chen, J K ^a   Tzou, D Y ^b   Beraun, J E ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b University of Missouri   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CARRIER CONCENTRATION; HEATING; LASERS;

BOLTZMANN EQUATIONS; SELF CONSISTENT MODEL;

SEMICONDUCTOR MATERIALS;

SEMICONDUCTOR;

EID: 10444263043     PISSN: 00179310     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijheatmasstransfer.2004.09.015     Document Type: Article

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