Structure analysis of ferroelectric Bi 4Ti 3O 12 by using X-ray powder diffraction

Journal of the Korean Physical Society

Volumn 45, Issue 5 II, 2004, Pages 1240-1243

  Jeon, Min Ku ^a   Woo, Seong Ihl ^a   Kim, Yong Il ^b   Nahm, Seung Hoon ^b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Korea Research Institute of Standards and Science   (South Korea)

Author keywords

Bi 4Ti 3O 12; Ferroelectric; Structure analysis; X ray diffraction

Indexed keywords

EID: 10444234257     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (12)

1. R. Ramesh, S. Aggarwal and O. Auciello, Mater. Sci. Eng. 32, 191 (1999).
2. B. H. Park, B. S. Kang, S. D. Bu, T. W. Noh . J. Lee and W. Jo, Nature 401, 682 (1999).
3. J. S. Kim, S. S. Kim and T. K. Song, J. Korean Phys. Soc. 43, 548 (2003).
4. H. J. Chang, S. H. Hwang, Y. C. Chang and M. Ishida, J. Korean Phys. Soc. 43, 123 (2003).
5. J. K. Kim, J.-H. Kim, J. Kim, S. S. Kim, E. K. Choi and T. K. Song, J. Korean Phys. Soc. 42, S1130 (2003).
6. B. Aurivillius, Ark. Kemi 2, 519 (1950).
7. E. C. Subbarao, Phys. Rev. 122, 804 (1961).
8. A. D. Rae, J. G. Thompson, R. L. Withers and A. C. Willis, Acta Cryst. B 46, 474 (1990).
9. C. H. Hervoches and P. Lightfoot . Chem. Mater. 11, 3359 (1999).
10. Y.-I. Kim, M. K. Jeon and S. I. Woo, J. Mater. Sci. Lett. 22, 1655 (2003).
11. B. H. Toby, J. Appl Cryst. 34, 210 (2001).
12. L. W. Finger, D. E. Cox and A. P. Jephcoat, J. Appl. Cryst. 27, 892 (1994).