A positron beam study of hydrogen confined in nano-cavities in crystalline silicon

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 216, Issue 1-4, 2004, Pages 251-256

  Schut, H ^a   Van Gog, H ^a   Van Veen, A ^a   Van Huis, M A ^a   Eijt, S W H ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Helium; Hydrogen; Nanocavity; Positron annihilation; Silicon

Indexed keywords

ADSORPTION; ANNEALING; CRYSTAL DEFECTS; CRYSTALLINE MATERIALS; DEUTERIUM; DIFFUSION IN SOLIDS; DISSOCIATION; DOPPLER EFFECT; ENTHALPY; HELIUM; HYDROGEN; ION IMPLANTATION; POSITRON ANNIHILATION SPECTROSCOPY;

IN-DIFFUSION; NANOCAVITIES;

SILICON;

EID: 1042288899     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2003.11.042     Document Type: Conference Paper

References (10)

1. van Veen A., Schut H., Mijnarends P.E. Coleman P.G. Positron Beams and Their Applications. 2000;191 World Scientific, Singapore.
2. Griffioen G.C., Evans J.H., de Jong P.C., van Veen A. Nucl. Instr. and Meth. B. 28:1987;360.
3. A. van Veen, H. Schut, J. de Vries, R.A. Hakvoort, M.R. Ijpma, in: P.J. Schultz, R. Massoumi, P.J. Simpson (Eds.), Positrons for Solids and Surfaces, AIP Conf. Proc. 218, AIP, New York, 1990, p. 171.
4. Ziegler J.F., Biersack J.P., Littmark U.L. SRIM 2000. 1985;Pergamon, New York.
5. Eijt S.W.H., Falub C.V., van Veen A., Schut H., Mijnarends P.E. Appl. Surf. Sci. 194:2002.
6. S.W.H. Eijt, C.V. Falub, A. van Veen, H. Schut, P.E. Mijnarends, M.A. van Huis. A.V. Fedorov, Mat. Res. Soc. Symp. Proc., Vol. 647, O.14.11, 2001, p. 1.
7. Grisolia J., Claverie A., Ben Assayag G., Godey S., Ntsoenzok E., Labhom F., Van Veen A. J. Appl. Phys. 91:2002;9027.
8. Kim H., Spila T., Grene J.E. Surf. Sci. 490:2001;L602.
9. Ichimiya T., Furuichi A. Int. J. Appl. Radiat. Isot. 19:1968;573.
10. van Wieringen A., Warmoltz N. Physica. 22:1956;849.